An X-Ray Line Broadening Analysis in the Vacuum-Evaporated Silver Films

Sen, Shrabanee; Halder, S. K.; Gupta, S. P. Sen

doi:10.1143/jpsj.38.1641

Cited by 44 publications

(20 citation statements)

References 18 publications

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“…Average crystallite size, D, and micro-strain, e, are obtained from true integral breadth, b i , of Pt(1 1 1) and Pt(2 2 2) reflections recorded in step-scan mode. For each Pt film, average crystallite size, D, and micro-strain, e, along (1 1 1) direction were obtained by relation (1) assuming distributions of D and e are both Gaussian [13]:…”

Section: Resultsmentioning

confidence: 99%

Effect of substrate temperature and annealing temperature on the structural, electrical and microstructural properties of thin Pt films by rf magnetron sputtering

Sreemany

Sen

2006

Applied Surface Science

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Section: Resultsmentioning

confidence: 99%

Effect of substrate temperature and annealing temperature on the structural, electrical and microstructural properties of thin Pt films by rf magnetron sputtering

Sreemany

Sen

2006

Applied Surface Science

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“…XRD spectra were also used to study the effect of incorporation of the element Sn in the NiO matrix respectively on the crystallite size, using the formula Debye-Scherrer [36,37], the stress [38] and dislocation density [39,40] …”

Section: Structural Analysesmentioning

confidence: 99%

Optical, Physical, Chemical and Electrical Properties of Nickel Oxide Sprayed Thin Films under Tin Doping Effects

Amor¹,

Hamzaoui²,

Boukhachem³

et al. 2015

Advances in Ceramic Science and Engineering

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Tin-doped nickel oxide thin films have been successfully prepared by spray pyrolysis technique on glass substrates at 460°C. The effects of tin doping on structural, optical, and electrical properties were investigated. X-ray diffraction pattern reveals that all prepared thin films have cubic structure with (111) preferred orientation. The surface topography of these films was performed by atomic force microscopy. Optical measurements show a high transparency in the visible range around 95%. The optical band gap Eg decreases with Sn content from 3.633 to 3.54 eV. PL measurements show some bands transition which shift irregularly with Sn doping. Finally, the electric conductivity of NiO thin film was investigated through the impedance spectroscopy measurements in the frequency range 5 Hz-13 MHz at various temperatures. These measurements show a thermally activation of the electric. AC conductivity of NiO thin films is investigated through Jonscher law. Also, from these measurements, dielectric parameters were calculated.

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“…The values of both interplanar spacing (d) and lattice constants are cited in Table 1. The crystallite size (D) of the prepared sample is estimated using Scherrer's formula [12].…”

Section: Resultsmentioning

confidence: 99%

Investigation of Structural and Spectroscopic Properties of Nanostructured CdS Films

Mochahari¹

2017

IJSRPAS

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Abstract-Nanostructured cadmium sulphide (CdS) films have been prepared on glass substrates by chemical bath deposition (CBD) method at room temperature. Analysis of the samples by x-ray diffraction (XRD) exhibits the films have cubic phase structure of CdS. Different structural parameters such as crystallite size (using Scherrer's relation) and dislocation density of the samples have been estimated. Optical absorption spectra of the sample falls in the visible region and various optical parameters such as optical band gap energy (using Tauc's formula), refractive index as well as dielectric constant have been calculated. Chemical composition of the samples has been investigated using fourier transform infra red (FTIR) spectroscopy.

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An X-Ray Line Broadening Analysis in the Vacuum-Evaporated Silver Films

Cited by 44 publications

References 18 publications

Effect of substrate temperature and annealing temperature on the structural, electrical and microstructural properties of thin Pt films by rf magnetron sputtering

Effect of substrate temperature and annealing temperature on the structural, electrical and microstructural properties of thin Pt films by rf magnetron sputtering

Optical, Physical, Chemical and Electrical Properties of Nickel Oxide Sprayed Thin Films under Tin Doping Effects

Investigation of Structural and Spectroscopic Properties of Nanostructured CdS Films

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