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2016
DOI: 10.15199/48.2016.11.29
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An universal test station for multichannel integrated neural amplifiers based on LabVIEW environment

Abstract: Modern technology allows for design of sophisticated measurement systems utilizing hundreds of independent recording channels. That imposes necessity of complex system functionality validation procedures development. The article describes an universal test system dedicated for tests of multichannel integrated circuits implemented in submicron technologies. Preliminary measurement results of a multichannel integrated circuit dedicated for advanced neurobiological experiments are also presented in the article. S… Show more

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