Abstract:Process and temperature variations have become a serious concern for ultra-low voltage (ULV) technology. The clock generator is the essential component for the ULV very-large-scale integration (VLSI). MOSFETs that are operated in the sub-threshold region are widely applied for ULV technology. However, MOSFETs at subthreshold region have relatively high variations with process and temperature. In this paper, process and temperature variations on the clock generators have been studied. This paper presents an ult… Show more
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