2022
DOI: 10.1016/j.jallcom.2022.165689
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An ultra-high power density supercapacitor: Cu(II) phthalocyanine tetrasulfonic acid tetrasodium salt doped polyaniline

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Cited by 18 publications
(12 citation statements)
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“…This showed that the diffusion rate of mobile ions in the 1000th cycle increased compared to the situation in the initial and 2000th cycles. 16,43,74,[78][79][80] The Cdl value, on the other hand, was at the highest level after 1000 cycles, in this case, it showed that the interaction at the electrode/electrolyte interface was the highest and the double layer capacitance is the highest in these cycles. 16,43,74,[81][82][83][84] To determine the charge-discharge behavior of the supercapacitor, galvanostatic charge-discharge tests were performed to PANI/SGO/NGO-3 including supercapacitor at a current density of 0.1 A g −1 between 0 and 1.5 V (Fig.…”
Section: Resultsmentioning
confidence: 67%
“…This showed that the diffusion rate of mobile ions in the 1000th cycle increased compared to the situation in the initial and 2000th cycles. 16,43,74,[78][79][80] The Cdl value, on the other hand, was at the highest level after 1000 cycles, in this case, it showed that the interaction at the electrode/electrolyte interface was the highest and the double layer capacitance is the highest in these cycles. 16,43,74,[81][82][83][84] To determine the charge-discharge behavior of the supercapacitor, galvanostatic charge-discharge tests were performed to PANI/SGO/NGO-3 including supercapacitor at a current density of 0.1 A g −1 between 0 and 1.5 V (Fig.…”
Section: Resultsmentioning
confidence: 67%
“…7a were attributed to the C-C (sp 2 ), C-O, C-N, N-CvN groups, respectively. 64,65 The peaks monitored at 398.11, 399.52 and 400.99 eV in the N 1s spectrum of the BPI-CF electrode indicated in Fig. 7b refer to the imine group (C-NvC), pyridinic N and secondary amine (C-N-H) structures, respectively.…”
Section: Dalton Transactions Papermentioning
confidence: 99%
“…In the equation, i X represents the feature set of fault events, including a subset of abnormal state alarm information based on signaling Di X and a subset of abnormal state alarm information based on switches Mi X , N representing the total number of fault events [6][7] .…”
Section:  mentioning
confidence: 99%