An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs

Takeuchi, Kozo; Kato, Takashi; Hashimoto, Masanori

doi:10.1109/irps48228.2024.10529442

2024 IEEE International Reliability Physics Symposium (IRPS) 2024

DOI: 10.1109/irps48228.2024.10529442

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An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs

Kozo Takeuchi,

Takashi Kato,

Masanori Hashimoto

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An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs

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