2013
DOI: 10.1504/ijrs.2013.057423
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An S-shaped software reliability model with imperfect debugging and improved testing learning process

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Cited by 14 publications
(11 citation statements)
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“…We consider Yamada model [6], where α is time-dependent exponentially increasing function, and nature of fault introduction rate is exponential. Further, we consider PNZ model [9] where αfalse(tfalse) is time-dependent, and nature of fault introduction rate is linearly increasing function, and also the Roy model [55] which presented that the fault introduction rate is constant.…”
Section: Main Textmentioning
confidence: 99%
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“…We consider Yamada model [6], where α is time-dependent exponentially increasing function, and nature of fault introduction rate is exponential. Further, we consider PNZ model [9] where αfalse(tfalse) is time-dependent, and nature of fault introduction rate is linearly increasing function, and also the Roy model [55] which presented that the fault introduction rate is constant.…”
Section: Main Textmentioning
confidence: 99%
“…Data Set-3 (DS3): DS3 (Telecommunication System Data [9]) was pair of the time of observation and the cumulative number of faults detected during 21 days of testing, measured on basis of the number of shifts spent running test cases, and analyzing the results 43 faults were detected.…”
Section: Main Textmentioning
confidence: 99%
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“…The failure intensity function, ie, λ ( t ), or mean value function, ie, m ( t ), is the building block of all NHPP models , which represents the number of faults detected per unit testing time. One simple class of NHPP is the mean value function model, which has an exponential growth of the cumulative number of failures experienced.…”
Section: Introductionmentioning
confidence: 99%
“…Xiao and Dohi 28 proposed a novel modeling approach for the NHPP-based software reliability models to describe the stochastic behavior of software fault detection processes. Roy et al 29 proposed an NHPP-based S-shaped SRGM in presence of imperfect debugging with a new exponentially increasing fault content function and S-shaped fault detection rate.…”
Section: Introductionmentioning
confidence: 99%