Abstract:Conductive adhesives have been used in the electronics industry for several years to attach chips to package lead frames in the semiconductor industry and for general interconnection of components to flexible circuits for various consumer products. Generally, these materials conduct equally in all directions. TO obtain pad isolation, the adhesives are screen printed to the pattem of the circuit pads. In the last few years, a new class of adhesives that are conductive in a single direction have been developed. … Show more
“…Manuscript Failures in ACF parts have been reported after temperature cycling, moisture preconditioning and autoclave. Available literature has suggested a variety of driving factors for interconnect failures, including oxidation of conductive particles, initial misalignment due to coplanarity issues, thermal stresses due to coefficient of thermal expansion (CTE) mismatch, post-assembly residual compressive stresses, polymer expansion due to moisture absorption, and degradation of the polymer at hightemperature [1]- [5]. However, no conclusive explanations or direct evidence can be found to pinpoint the major cause of ACF electrical failures.…”
Anisotropic conductive film (ACF) consists of an adhesive polymer matrix with dispersed conductive particles. In flip-chip technology, ACF has been used in place of solder and underfill for chip attachment to glass or organic substrates. The filler particles establish the electrical contacts between the interconnecting areas. ACF flip-chip bonding provides finer pitch, higher package density, reduced package size and improved lead-free compatibility. Nevertheless, the interconnection is different from traditional solder joints, the integrity and durability of the ACF interconnects have major concerns.Failures in anisotropic conductive film (ACF) parts have been reported after temperature cycling, moisture preconditioning and autoclave. The failures have not been well understood and have been attributed to a wide variety of causes. This paper investigates the failure mechanism of ACF using finite element simulation. From a failure-initiation point of view, the response of ACF packages to environmental (temperature and humidity) exposure is very different from standard underfilled packages. These differences cause the ACF package to fail in different ways from an underfilled package.Simulation results have shown that moisture-induced ACF swelling and delamination is the major cause of ACF failure. With moisture absorption, the loading condition at the interface is tensile-dominant, which corresponds to lower interface toughness (or fracture resistance). This condition is more prone to interface delamination. Therefore, the reliability of ACF packages is highly dependent on the ACF materials. The paper suggests a new approach toward material selection for reliable ACF packages. This approach has very good correlation with experimental results and reliability testing of various ACF materials.
“…Manuscript Failures in ACF parts have been reported after temperature cycling, moisture preconditioning and autoclave. Available literature has suggested a variety of driving factors for interconnect failures, including oxidation of conductive particles, initial misalignment due to coplanarity issues, thermal stresses due to coefficient of thermal expansion (CTE) mismatch, post-assembly residual compressive stresses, polymer expansion due to moisture absorption, and degradation of the polymer at hightemperature [1]- [5]. However, no conclusive explanations or direct evidence can be found to pinpoint the major cause of ACF electrical failures.…”
Anisotropic conductive film (ACF) consists of an adhesive polymer matrix with dispersed conductive particles. In flip-chip technology, ACF has been used in place of solder and underfill for chip attachment to glass or organic substrates. The filler particles establish the electrical contacts between the interconnecting areas. ACF flip-chip bonding provides finer pitch, higher package density, reduced package size and improved lead-free compatibility. Nevertheless, the interconnection is different from traditional solder joints, the integrity and durability of the ACF interconnects have major concerns.Failures in anisotropic conductive film (ACF) parts have been reported after temperature cycling, moisture preconditioning and autoclave. The failures have not been well understood and have been attributed to a wide variety of causes. This paper investigates the failure mechanism of ACF using finite element simulation. From a failure-initiation point of view, the response of ACF packages to environmental (temperature and humidity) exposure is very different from standard underfilled packages. These differences cause the ACF package to fail in different ways from an underfilled package.Simulation results have shown that moisture-induced ACF swelling and delamination is the major cause of ACF failure. With moisture absorption, the loading condition at the interface is tensile-dominant, which corresponds to lower interface toughness (or fracture resistance). This condition is more prone to interface delamination. Therefore, the reliability of ACF packages is highly dependent on the ACF materials. The paper suggests a new approach toward material selection for reliable ACF packages. This approach has very good correlation with experimental results and reliability testing of various ACF materials.
“…The unidirectional conduction is achieved by using a relatively low volume fraction of conductive fillers. This low filler loading is insufficient for inter-particle contact and prevents conduction in the X − Y plane of the adhesive, but enough particles are present to assure reliable conduction between bonding electrodes in the Z direction [2] . Because of the anisotropy, ACAs can be deposited over the entire contact region, greatly expanding the bonding area.…”
Section: Introduction To Anisotropic Conductive Adhesive Technologymentioning
confidence: 99%
“…Both thermoplastic and thermosetting resins have been used as adhesive matrices. The principal advantage of thermoplastic ACAs is the relative ease to disassemble the interconnections for repair operation, while thermosetting adhesives possess higher strength at elevated temperature and form more robust bonds [2] . The commonly used conductive fillers include silver and nickel particles and polymer spheres coated with metal (Ni/Au).…”
Section: Introduction To Anisotropic Conductive Adhesive Technologymentioning
Anisotropic conductive adhesive technology for electronics packaging and interconnect application has significantly been developed during the last few years. It is time to make a summary of what has been done in this field. The present paper reviews the technology development, especially from the reliability point of view. It is pointed out that anisotropic conductive adhesives are now widely used in many applications and the reliability data and models have been developed to a large extent for anisotropic conductive adhesives in various applications.
“…Largescale integrated chips with high input-outputs (I/Os) often provide a solution for the shrinkage of product size and weight. The adhesive flip-chip assembly has gained popularity in chip packaging as it offers a low-cost, lead (Pb)-free, fine-pitch, and a simple and low-temperature processing solution [1]- [3]. The launch of anisotropic conductive adhesive in the market enhanced the development of display products by offering very fine-pitch development.…”
Electronic portable devices are aimed towards higher response speed with a better viewing resolution display. Nonconductive paste (NCP) and nonconductive film (NCF) are the adhesive materials used in fine-pitch display applications. This study compares two commercially available adhesives for fine-pitch chip-on-flex (COF) applications. The electrical performance of the NCP-bonded COF was better compared to the NCF. The rheological properties of these materials in the initial stages and the mechanical properties of the adhesives after bonding are claimed to be the main factors. The semisolid form of the NCF which melts and flows slowly from the interconnection joints finally reduced the effective contact area in the joint as compared to the NCP. A low-pressure bonding caused entrapment of adhesive in the joints, induced stress accumulation in the -direction during high thermal loading, and a high coefficient of thermal expansion (CTE) mismatch in between bumps, adhesive, and electrode traces on the flexible substrate were the key factors for the degradation of electrical conductivity. A high load of 100 N and above was recommended since the effective contact area built into the interconnection was good and reliable after 400 cycles of a thermal shock test of 55 C-125 C. The NCP with a higher elastic modulus which ensures higher stiffness and stability towards elongation gave a better reliability in this environmental test. Cross sectioning and SEM analysis provide evidence of the effective contact area of the joint before and after the thermal cycle environmental test.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.