2005
DOI: 10.1007/bf02730134
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An iterative method for computing the surface resistance of YBCO thin films in the nonlinear regime of RF power

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Cited by 1 publication
(3 citation statements)
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“…Although there is a minor change in these geometrical factors, a clear quadratic change is shown above a certain microwave input power ($0.01 W). This shows once again [3] that geometrical factors should not be considered constant over the whole range of input power. At higher power, these factors are subject to even further change.…”
Section: Comparison Of Our Numerical Calculations With Experimental Rmentioning
confidence: 91%
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“…Although there is a minor change in these geometrical factors, a clear quadratic change is shown above a certain microwave input power ($0.01 W). This shows once again [3] that geometrical factors should not be considered constant over the whole range of input power. At higher power, these factors are subject to even further change.…”
Section: Comparison Of Our Numerical Calculations With Experimental Rmentioning
confidence: 91%
“…The main reason of the difference in some fitting parameters could be the quality of the film that depends on many preparation factors. The fitting parameters that depend on temperature have been determined previously for the case of linear regime [3], which are valid for the case of nonlinear regime. Other fitting parameters (j 1 and j 2 ) have been determined for the case of nonlinear regime according to Eqs.…”
Section: Comparison Of Our Numerical Calculations With Experimental Rmentioning
confidence: 99%
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