An ion beam profiler based on secondary electron emission

Xiaohu, 王小胡 Wang; Zhen, 杨振 Yang; Linwen, 章林文 Zhang; Jidong, 龙继东 Long; Tao, 魏涛 Wei; Guojun, 杨国君 Yang; Zhuo, 张卓 Zhang

doi:10.3788/hplpb20132508.2121

强激光与粒子束

2013

DOI: 10.3788/hplpb20132508.2121

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An ion beam profiler based on secondary electron emission

王小胡 Wang Xiaohu¹,

杨振 Yang Zhen²,

章林文 Zhang Linwen³

et al.

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An ion beam profiler based on secondary electron emission

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