2018
DOI: 10.1109/jmems.2018.2875338
|View full text |Cite
|
Sign up to set email alerts
|

An Investigation on the Effects of Contact in MEMS Oscillators

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
9
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
4
2
1

Relationship

3
4

Authors

Journals

citations
Cited by 19 publications
(10 citation statements)
references
References 55 publications
0
9
0
Order By: Relevance
“…a single Q value, for the whole structure. This assumption is of current use in MEMS community, and it has shown to be reliable for a number of test cases [78,79].…”
Section: Applicationsmentioning
confidence: 99%
See 1 more Smart Citation
“…a single Q value, for the whole structure. This assumption is of current use in MEMS community, and it has shown to be reliable for a number of test cases [78,79].…”
Section: Applicationsmentioning
confidence: 99%
“…a single Q value, for the whole structure. This assumption is of current use in MEMS community, and it has shown to be reliable for a number of test cases [78,79]. The ROMS are derived thanks to the second-order DNF method, where the nonlinear mapping is truncated at second-order while the reduced dynamics is truncated at third-order.…”
Section: Applicationsmentioning
confidence: 99%
“…However, it is worth mentioning that FCs in MEMS might be associated with different phenomena. An example is discussed in [19] where FCs arise as a consequence of intermittent contact between deformable beams in a MEMS structure.…”
mentioning
confidence: 99%
“…a single Q value, for the whole structure. This assumption is of current use in MEMS community, and it has shown to be reliable for a number of test cases [80,81].…”
Section: Applicationsmentioning
confidence: 99%