An investigation of the SONOS with side-block oxide for non-volatile memory

Tseng, Shih-Chuan; Lin, Jyi-Tsong; Hsu, Sung Po

doi:10.1109/eleco.2013.6713868

2013 8th International Conference on Electrical and Electronics Engineering (ELECO) 2013

DOI: 10.1109/eleco.2013.6713868

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An investigation of the SONOS with side-block oxide for non-volatile memory

Shih-Chuan Tseng

Jyi-Tsong Lin

Sung Po Hsu

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An investigation of the SONOS with side-block oxide for non-volatile memory

Cited by 1 publication

References 8 publications

Performance study of side block oxide band gap engineered SONOS: A device simulation approach

Performance study of side block oxide band gap engineered SONOS: A device simulation approach

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