2003
DOI: 10.1149/1.1605746
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An Investigation of the Plasma Chemistry Involved in the Synthesis of ZnO by PECVD

Abstract: Plasma-enhanced chemical vapor deposition ͑PECVD͒ of zinc oxide was accomplished using diethyl zinc, oxygen, and argon in a capacitively coupled reactor. The plasma chemistry was studied by optical emission spectroscopy ͑OES͒ with particular focus on the effects of reactant composition and rf power. Process-property relationships were established by comparing plasma behavior with resulting film properties as characterized by the Hall effect, spectroscopic ellipsometry, and X-ray diffraction. In our studies of … Show more

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Cited by 35 publications
(33 citation statements)
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References 32 publications
(31 reference statements)
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“…The reactor used to deposit the ZnO thin films is a parallel plate, capacitively-coupled system that has been described in detail previously [48]. Full Paper The DMZ was stored in a temperature controlled bubbler (À15 8C) and its flow rate (F DMZ ) was controlled by altering the bubbler pressure (P B ) using a needle valve.…”
Section: Methodsmentioning
confidence: 99%
“…The reactor used to deposit the ZnO thin films is a parallel plate, capacitively-coupled system that has been described in detail previously [48]. Full Paper The DMZ was stored in a temperature controlled bubbler (À15 8C) and its flow rate (F DMZ ) was controlled by altering the bubbler pressure (P B ) using a needle valve.…”
Section: Methodsmentioning
confidence: 99%
“…(1) For these same advantages PEC-VD has recently been extended to the synthesis of numerous metal oxide thin films including advanced dielectrics (Ta 2 O 5 , (2) HfO 2 , (3,4) ZrO 2 , (5,6) Ga 2 O 3 , (7) ), electrochromics (WO 3 , (8,9) V 2 O 5 (10,11) ), transparent conductors (SnO 2 , (12,13) ZnO (14,15) ), optical coatings (Al 2 O 3 , (16,17) TiO 2 (18) ), and complex oxides (yittria-stabilized zirconia, (19,20) BaTiO 3 , (21) SrTiO 3 (20,22) ). For the most part the efforts to date have been experimental, focused on intrinsic film properties and relationships to device performance.…”
Section: Introductionmentioning
confidence: 99%
“…(5)(6)(7)(8)(9)(12)(13)(14)(17)(18)(19)(20)(21) However, to date there has been little or no plasma modeling performed on these systems. Plasma modeling has proven to be a particularly useful tool for microelectronic manufacturing.…”
Section: Introductionmentioning
confidence: 99%
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