An investigation of the parametric X-rays along the velocity of emitting particle

Kubankin, A. S.; Nasonov, N. N.; Сергиенко, В. И.; Vnukov, I. E.

doi:10.1016/s0168-583x(02)01816-5

Cited by 30 publications

(11 citation statements)

References 20 publications

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“…Baryshevsky [62] proposed to search for the predicted forwarddiffracted wave (FDPXR) which is associated to PXR and emitted close to the direction of the electron propagation. Similar proposals have also been communicated by Nasonov [63,64]. In ref.…”

Section: Measurement Of Forward-diffracted Pxrsupporting

confidence: 71%

Coherent X-rays at MAMI

et al. 2006

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Abstract. Coherent radiation in the range from soft X-rays up to hard X-rays, produced by the lowemittance electron beam of MAMI, can be used for various applications. Novel types of interferometers have been developed for the measurement of the complex index of refraction of thin self-supporting foils. For the vacuum ultraviolet and soft X-ray region the interferometer consists of two collinear undulators, and a grating spectrometer. A foil placed between the undulators causes a phase shift and an attenuation of the oscillation amplitude. The complex index of refraction has been measured at the L 2,3-absorption edges of nickel. A novel method is described for the measurement of the X-ray magnetic circular birefringence. For the hard X-ray region the interferometer consists of two foils at which the 855 MeV electron beam produces transition radiation. Distinct interference oscillations have been observed as a function of both, the photon emission angle and the distance between the foils. The refractive index decrement δ(ω) of a 2 µm thick nickel sample foil has been measured at X-ray energies around the K absorption edge at 8333 eV and at 9930 eV with an accuracy of better than 1.5 %. The line width of parametric X radiation (PXR) was measured in backward geometry with a Si single-crystal monochromator. Upper limits of the line width of 42 meV, 50 meV, and 44 meV, have been determined for the (333), (444) and (555) reflections at photon energies of 5932 eV, 7909 eV, and 9887 eV, respectively. Small angle scattering of the electrons in the crystal leads to a stochastic frequency modulation of the exponentially damped wave train which results in the line broadening. To elucidate the quest if the production of PXR is a kinematical or a dynamical process the radiation from silicon single-crystal targets, emitted close to the electron direction, has been studied. The observed interference structures and the narrow-band radiation in forward direction shows that PXR is produced in a dynamical process. .Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) -41.60.-m Radiation by moving charges -41.50.+h X-ray beams and X-ray optics PACS.

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Section: Measurement Of Forward-diffracted Pxrsupporting

confidence: 71%

Coherent X-rays at MAMI

et al. 2006

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“…Baryshevsky [22] proposed to search for the predicted forward diffracted wave which is associated to PXR and emitted close to the direction the electron travels. Similar proposals have also been communicated by Nasonov [23,24]. A number of unsuccessful experiments were performed for the search of such a forward diffracted parametric X radiation (FDPXR) [25][26][27][28].…”

Section: Introductionmentioning

confidence: 96%

<title>Forward diffracted parametric X radiation from a thick Tungsten single crystal at 855 MeV electron energy</title>

et al. 2007

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Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 µm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101) plane at a Bragg angle of 3.977• . Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

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“…Dynamic effects in PXR were reported in [5][6][7][8] in a geometry of symmetric reflection, where PXR is generally formed due to the main branch of the solution to the dispersion equation for x-rays in a crystal. In the Bragg scattering geometry in the case of symmetric reflection, the surface of the crystal target is parallel to the diffracting crystal surfaces (δ = 0).…”

Section: Introductionmentioning

confidence: 99%