An investigation of evanescent wave-induced fluorescence spectroscopy for exploring high refractive index media

Abstract

Evanescent wave-induced fluorescence spectroscopy (EWIFS) is a widely used technique for probing the interfacial behavior of different complex media in investigations of samples in the physical, chemical, and biological sciences. This technique takes advantage of the sharply decaying evanescent field, established following total internal reflection (TIR) at the interface of two media, for spatially identifying the photoluminescence characteristics of the sample. The generation of the evanescent field requires the refractive index of the second medium to be lower than that of the first, so a major disadvantage of this increasingly widely used spectroscopic technique is the inability to exploit the advantages of EWIFS to image a sample with a higher refractive index than the incident substrate medium. A proposed configuration in which a thin, low refractive index intermediate layer is established between the TIR substrate and a high refractive index sample is investigated. We illustrate that this arrangement does not afford the desired advantages of evanescent field-induced fluorescence measurements for investigating high refractive index media.