Abstract:Combinatorial test generation, also called t-way testing, is the process of generating sets of input parameters for a system under test, by considering interactions between values of multiple parameters. In order to decrease total testing time, there is an interest in techniques that generate smaller test suites. In our previous work, we used graph techniques to produce high-quality test suites. However, these techniques require a lot of computing power and memory, which is why this paper investigates distribu… Show more
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