2020 94th ARFTG Microwave Measurement Symposium (ARFTG) 2020
DOI: 10.1109/arftg47584.2020.9071748
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An Interferometric Characterization Technique for Extreme Impedance Microwave Devices

Haris Votsi
1
,
Laurence Stant
2
,
Cristian Matei
3
et al.
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