2019
DOI: 10.3390/a12090183
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An Intelligent Warning Method for Diagnosing Underwater Structural Damage

Abstract: A number of intelligent warning techniques have been implemented for detecting underwater infrastructure diagnosis to partially replace human-conducted on-site inspections. However, the extensively varying real-world situation (e.g., the adverse environmental conditions, the limited sample space, and the complex defect types) can lead to challenges to the wide adoption of intelligent warning techniques. To overcome these challenges, this paper proposed an intelligent algorithm combing gray level co-occurrence … Show more

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Cited by 5 publications
(2 citation statements)
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References 38 publications
(29 reference statements)
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“…Subsequently, for the first time, a specialized monitoring system was implemented for the detection and diagnosis of failures in a nuclear plant [ 5 , 12 , 13 ]. In recent years, promising techniques have been investigated and applied, such as parity space [ 14 , 15 , 16 ], fuzzy logic, and neural networks [ 17 , 18 , 19 ], among others. In Figure 1 the fault detection techniques are shown and in particular the Data-Drive Based method are underlined in a red color.…”
Section: Discussion and Analysis Of The Existing Literaturementioning
confidence: 99%
See 1 more Smart Citation
“…Subsequently, for the first time, a specialized monitoring system was implemented for the detection and diagnosis of failures in a nuclear plant [ 5 , 12 , 13 ]. In recent years, promising techniques have been investigated and applied, such as parity space [ 14 , 15 , 16 ], fuzzy logic, and neural networks [ 17 , 18 , 19 ], among others. In Figure 1 the fault detection techniques are shown and in particular the Data-Drive Based method are underlined in a red color.…”
Section: Discussion and Analysis Of The Existing Literaturementioning
confidence: 99%
“…Accordingly, fault detection and classification (FDC) in semiconductor manufacturing is now generally accepted as an integral element of the APC (advanced process control) framework for maximizing production efficiency (yield and machine utilization) while minimizing process variation [ 18 ]. The semiconductor industry has benefited from developing and implementing many FDC techniques that aid in issue identification and root cause investigation.…”
Section: Discussion and Analysis Of The Existing Literaturementioning
confidence: 99%