An intelligent framework for fault diagnosis in 89c51RD2 Microcontroller based system

Kodavade, D. V.; Apte, Shaila Dinkar

doi:10.1109/idaacs.2009.5342978

Cited by 1 publication

(2 citation statements)

References 3 publications

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“…Dattatraya [30] proposed an expert work for fault diagnosis of the Philips 89v52RD2 microcontroller. He proposed checking experiments for every fault, based on the intelligent diagnostic assessment and management of testing process.…”

Section: Introductionmentioning

confidence: 99%

“…This strategy is limited to test a microcontroller with high fault coverage, and needs huge alteration to get the proper knowledge base. In addition, the authors in [30] did not illustrate the memory utilization, test application time, and the fault coverage for the Philips 89v52RD2 microcontroller under test. Therefore, the authors did not prove the applicability of this test strategy.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

New Hybrid-Based Self-Test Strategy for Faulty Modules of Complex Microcontroller Systems

El-Mahlawy¹,

Hussein²,

Mohamed³

2019

ELS

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In this paper, a new hybrid test strategy, called hybrid-based self-test (HYBST), is presented to test complex digital circuits such as microcontrollers. This test strategy integrates the signature multi-mode hardware-based self-test (SM-BST) with the software-based self-test (SBST). In this test strategy, the microcontroller is divided into a number of main modules, and then test subroutines are used to functionally test each module, based on its instruction set architecture (ISA). The ISA is used to generate test subroutines that represent test pattern generators (TPGs) and part of the test controller. The SMHBST represents the other part of the test controller and the test response compaction (TRC). The experimental results illustrate the superiority of the HYBST in the memory utilization, test application time, testing of internal modules of the microcontroller, and testing of general-purpose input-output (GPIO) pins of the microcontroller. In addition, an integrated test solution for fault diagnosis of the circuit boards including random logic integrated circuits (ICs) and microcontroller chips is presented to indicate a real practical test strategy.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%