2018
DOI: 10.1016/j.sse.2018.08.006
|View full text |Cite
|
Sign up to set email alerts
|

An insight to mobility parameters for AOSTFTs, when the effect of both, localized and free carriers, must be considered to describe the device behavior

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
7
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
4
1

Relationship

2
3

Authors

Journals

citations
Cited by 10 publications
(7 citation statements)
references
References 20 publications
0
7
0
Order By: Relevance
“…The AFCM, including the current-voltage and the capacitance-voltage models [5] and [6], respectively, was described in Verilog-A language, and used in SmartSpice from Silvaco, to simulate the analyzed circuits. As already indicated, the AFCM includes the extrinsic effects of the overlaps on the internal capacitances of the transistors shown in Fig.…”
Section: Analysis and Discussion Of The Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…The AFCM, including the current-voltage and the capacitance-voltage models [5] and [6], respectively, was described in Verilog-A language, and used in SmartSpice from Silvaco, to simulate the analyzed circuits. As already indicated, the AFCM includes the extrinsic effects of the overlaps on the internal capacitances of the transistors shown in Fig.…”
Section: Analysis and Discussion Of The Resultsmentioning
confidence: 99%
“…The extraction of the required model parameters was done as reported in [5,6], after which obtained parameters were introduced in the simulator. The extracted values are shown on Table I.…”
Section: Qgd = Cgd*v(gdp); Qgs = Cgs*v(gsp);mentioning
confidence: 99%
See 1 more Smart Citation
“…The second modelling approach for AOS TFTs considers initially two exponential DOS [73][74][75]. One of the exponential terms accounts for the deep states and the other one for the acceptor states [76,77,78,79], as in a-Si:H TFTs [80,81,82].…”
Section: Iii2 Umem-based Modelmentioning
confidence: 99%
“…T is the operation temperature of the device under study. In [75] an expression for µ FET0 is given, in terms of the band mobility, γ, trap density and Fermi potential, and density of states in the bottom of the conduction band. The saturation modulation parameter (α S ) defines the saturation voltage as =∝ ( − ).…”
Section: A Drain Current Modelmentioning
confidence: 99%