An Inquiry-Based Introduction to Atomic Force Microscopy Techniques through Optical Storage Disc Surface Imaging

Abstract

Scanning probe microscopy such as atomic force microscopy has become increasingly integrated and relevant in undergraduate laboratory investigations. As the "hands and eyes of the nanoworld", atomic force microscopes (AFMs) continue to be used to innovate the nanowriting process for data storage and in the exploration of novel materials suitable for ultrafast, nonvolatile, high density memory storage. Optical storage discs (OSDs) coevolved with AFM technology, are relatively inexpensive, and are easily available for purchase. They can, consequently, serve as a relevant phenomenon for undergraduate students to explore nanoscale material structure and macroscopic function through an AFM. The guided inquiry investigation presented here introduces students to the design and basic functions of an AFM through their identification of three unknown OSD samples (CD, DVD, or Blu-ray). The surface of each OSD is explored through students' collection and interpretation of topographic and force curve data using an AFM to identify differences in the structure of the grooves containing pits and lands, estimation of theoretical storage capacity, and finally distinguish OSD types by comparing their data and calculations to known structures and capacities.

Atomic Force Microscopy for Teaching Polymer Crystals and Polymer Blends

“…23 by AFM nanoindentation were used to familiarize students with quantifying elastomer stiffness, 24 examining the connection between surface functionalization and adhesion forces, 25 and determining the attractive−repulsive forces of optical storage discs. 26 Our work bridges the gap between the macro-and nanoscale observations of polymer materials with distinctive surface topographies and highlights the AFM's nanoscale resolution capabilities. In addition, our approach allows the integration of surface topography imaging and force curve mapping to enable the quantitative analysis of Young's modulus, deformation, and stiffness in nonhomogeneous polymeric materials.…”

“…AFM introduces students to the characterization of polymer materials at the nanoscale level as it measures a range of material characteristics such as surface morphology, roughness, elasticity, stiffness, and surface adhesion. − For instance, in previous reports, students were introduced to nanoscale-resolution topography imaging for surface characterization of various materials, including polyvinylpyrrolidone films, silver wires, gold nanoparticles, and dewaxed tomato cuticles . Force curves obtained by AFM nanoindentation were used to familiarize students with quantifying elastomer stiffness, examining the connection between surface functionalization and adhesion forces, and determining the attractive–repulsive forces of optical storage discs . Our work bridges the gap between the macro- and nanoscale observations of polymer materials with distinctive surface topographies and highlights the AFM’s nanoscale resolution capabilities.…”

Development and Implementation of a Two-Level Inquiry- and Project-Based Modular Approach to Teaching a Second-Semester Physical Chemistry Laboratory Course

“…As a part of the School’s research efforts in the area of chemistry education, − the current modular approach can be used in the other advanced chemistry laboratory courses by adding more modules focusing on different topics. As for potential adaptations by other institutions, Module 1 can be directly used by Physical Chemistry Laboratory courses when the instruments and techniques such as NMR are available or with minor changes to adopt to their own instrumentation at institutions.…”