An in-circuit noncontacting measurement method for S-parameters and power in planar circuits

Stenarson, J.; Yhland, K.; Wingqvist, Claes

doi:10.1109/22.971651

Cited by 28 publications

(15 citation statements)

References 8 publications

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“…However, for the determination of the scattering parameters of an embedded component independent of the remaining circuit, the conventional measurement setup is not applicable. Therefore, a contactless vector network analysis setup, as described in [1] and [2], can be used. The implementation of the contactless measurement setup can be realized with the help of different coupling structures.…”

Section: Introductionmentioning

confidence: 99%

Contactless Vector Network Analysis With Printed Loop Couplers

Zelder

Geck

Wollitzer

et al. 2008

IEEE Trans. Microwave Theory Techn.

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In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.Index Terms-Calibration technique, contactless scattering-parameter measurement, electromagnetic probe, microwave circuit testing, vector network analyzer (VNA).

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Section: Introductionmentioning

confidence: 99%

Contactless Vector Network Analysis With Printed Loop Couplers

Zelder

Geck

Wollitzer

et al. 2008

IEEE Trans. Microwave Theory Techn.

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“…A promising method is the contactless vector network analysis proposed by Stenarson et al (2001), Zelder et al (2007a). A simplified two-port setup of this contactless measurement technique is illustrated in Fig.…”

Section: Introductionmentioning

confidence: 99%

Usage of the contactless vector network analysis with varying transmission line geometries

et al. 2008

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Abstract. The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.

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“…De Groote et al (2006) and Yhland and Stenarson (2006) applied electromagnetic loops as contactless coupling structures. In contrast to this approach, by Zelder et al (2007) and Stenarson et al (2001), pure inductive or capacitive probes are used. A principle setup of a contactless vector network analyzer system using two probes is shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

Contactless vector network analysis using diversity calibration with capacitive and inductive coupled probes

2007

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Abstract. Contactless vector network analysis based on a diversity calibration is investigated for the measurement of embedded devices in planar circuits. Conventional contactless measurement systems based on two probes for each measurement port have the disadvantage that the signal-to-noise system dynamics strongly depends on the distance between the contactless probes.In order to avoid a decrease in system dynamics a diversity based measurement system is presented. The measurement setup uses one inductive and two capacitive probes. As an inductive probe a half magnetic loop in combination with a broadband balun is introduced. In order to eliminate systematic errors from the measurement results a diversity calibration algorithm is presented. Simulation and measurement results for a one-port configuration are shown.

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An in-circuit noncontacting measurement method for S-parameters and power in planar circuits

Cited by 28 publications

References 8 publications

Contactless Vector Network Analysis With Printed Loop Couplers

Contactless Vector Network Analysis With Printed Loop Couplers

Usage of the contactless vector network analysis with varying transmission line geometries

Contactless vector network analysis using diversity calibration with capacitive and inductive coupled probes

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