Abstract. TUNCUR codes are aimed at a coherent calculation of both equilibrated structures and electronic properties of a substrate and STM tip altogether with the tunneling current between them in the framework of the same computational scheme. Both objects are modeled by atomic clusters. Quantum chemical calculations in TUNCUR codes are provided by sequential programs CLUSTER-Z1 and CLUSTER-Z2 that perform HF SCF calculations in the valence sp-and spd-basis, respectively. TUNCUR consist of three blocks that provide calculations of STM recordings in two modes of operation as well as computing local density of states. All calculations are performed over a grid of variable parameters.
1.IntroductionSince its invention [1], scanning tunneling microscopy (STM) has proven to be a powerful technique in viewing the surface structure of various systems with atomic resolution. In this technique, a small bias voltage V is applied between a sample and an "atomically sharp" tip, which yields a tunneling current I at typical tip-to-surface separation of several angstroms. Depending on the polarity of V, the tunneling occurs by transfer of electrons either from occupied states of the sample into unoccupied states of the tip, or from the tip to the sample. In the topographic mode (I=const mode) of STM operation [1], a feedback mechanism changes the tip-to-surface separation in order to keep the tunneling current constant. The STM image is given by recording the distance changes during a scan of the surface. In the alternative currentimaging mode (H=const mode) [2], an STM image is constituted by recording the tunneling current, as the tip scans the surface at a constant distance. No method has not been so powerful as SMT in observing a direct image of a surface on an atomic scale. However, numerous STM applications have revealed that STM does not necessarily image the atomic structure of the surface as a naïve ball model, but represents rather very delicate features of the surface electronic states (see [3,4] and references there in). That is why STM so greatly needs a thorough theoretical analysis and/or calculations to decode profound information from the experimental images, as no other conventional method of the surface characterization such as electron microscopy or low-energy electron diffraction.