2016
DOI: 10.1109/tmtt.2016.2606389
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An Improved Two-Port Transmission Line Permittivity and Permeability Determination Method With Shorted Sample

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Cited by 35 publications
(28 citation statements)
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“…The former encompasses a series of methodologies that use a voltage standing wave in frequency domain, as a result of an incident and reflected signal. Depending on the distinguishing parameter selected, some establish relationship between permittivity and resonance frequency [25,38,39], whereas other relate the permittivity with the reflection and transmission coefficient [40,41,42,43,44,45,46,47,48,49]. Regarding capacitance techniques, the permittivity of the medium is determined by measuring the charge time of a capacitor which modifies the operating frequency of an oscillator.…”
Section: Introductionmentioning
confidence: 99%
“…The former encompasses a series of methodologies that use a voltage standing wave in frequency domain, as a result of an incident and reflected signal. Depending on the distinguishing parameter selected, some establish relationship between permittivity and resonance frequency [25,38,39], whereas other relate the permittivity with the reflection and transmission coefficient [40,41,42,43,44,45,46,47,48,49]. Regarding capacitance techniques, the permittivity of the medium is determined by measuring the charge time of a capacitor which modifies the operating frequency of an oscillator.…”
Section: Introductionmentioning
confidence: 99%
“…There are several techniques for characterizing dielectric material properties, such as relative permittivity and loss tangent, at the RF and microwave spectrum. In recent years, a lot of research activities have been aiming at improving the accuracy and sensitivity of material characterization, especially at frequencies below 50 GHz [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. However, very few contributions attempt to characterize dielectric and semiconductor materials at the millimeter-wave and THz frequency bands [18][19][20][21][22], [27], which are becoming increasingly important in various applications in sciences and engineering.…”
Section: Introductionmentioning
confidence: 99%
“…However, very few contributions attempt to characterize dielectric and semiconductor materials at the millimeter-wave and THz frequency bands [18][19][20][21][22], [27], which are becoming increasingly important in various applications in sciences and engineering. Even so, there are currently only six commercial material characterization techniques available to date [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17] and only two of which are suitable at the frequencies above 50 GHz.…”
Section: Introductionmentioning
confidence: 99%
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“…However, extracted ε r μ r are stable near the resonance frequencies. That has been presented by National Institute of Standards and Technology (NIST) in References 9 and 11. In this letter, the ε r shown in Equation ) is equal to ε r μ r since the materials under test are dielectric.…”
Section: Methodsmentioning
confidence: 90%