An imaging approach for the automatic thresholding of photo defects

Bhardwaj, Neelam; Agarwal, Suneeta; Bhardwaj, Vikash

doi:10.1016/j.patrec.2015.03.019

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Cited by 6 publications

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“…The previous approach by Moghaddam and Cheriet [7] was based on an adaptive multi-scale binarization algorithm. Bhardwaj et al [8] presented a new technique for photo defect detection, by sensing the light after it passes through the photo and then thresholding the digitized image to identify defect objects. Zhang et al [9] proposed a framework, based on an inpainting algorithm, and a shape-from-shading technique, to remove unwanted distortions in digitized image from printed documents.…”

Section: Introductionmentioning

confidence: 99%