2009 15th IEEE International on-Line Testing Symposium 2009
DOI: 10.1109/iolts.2009.5195977
|View full text |Cite
|
Sign up to set email alerts
|

An I-IP based approach for the monitoring of NBTI effects in SoCs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2017
2017
2017
2017

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 11 publications
0
0
0
Order By: Relevance