An <i>in situ</i> diffraction study of domain wall motion contributions to the frequency dispersion of the piezoelectric coefficient in lead zirconate titanate

Seshadri, Shruti B.; Prewitt, Anderson D.; Studer, Andrew J.; Damjanović, Dragan; Jones, Jacob L.

doi:10.1063/1.4789903

Cited by 29 publications

(21 citation statements)

References 21 publications

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“…It is widely accepted that domain wall motions can contribute to functional responses in ferroelectrics and there has been some experimental evidence for these extrinsic effects revealed by neutron diffraction and high-frequency dielectric measurements [165–167]. Considering the domain wall motion is a relaxation process, frequency related loss behavior could provide some quantified measurements for the relaxation coefficient, so that high frequency ultrasonic spectroscopy should be a powerful tool to evaluate the extrinsic loss in ferroelectrics.…”

Section: Extrinsic Loss Mechanismsmentioning

confidence: 99%

Losses in ferroelectric materials

Liu

Zhang

Jiang

et al. 2015

Materials Science and Engineering: R: Reports

256

112

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Ferroelectric materials are the best dielectric and piezoelectric materials known today. Since the discovery of barium titanate in the 1940s, lead zirconate titanate ceramics in the 1950s and relaxor-PT single crystals (such as lead magnesium niobate-lead titanate and lead zinc niobate-lead titanate) in the 1980s and 1990s, perovskite ferroelectric materials have been the dominating piezoelectric materials for electromechanical devices, and are widely used in sensors, actuators and ultrasonic transducers. Energy losses (or energy dissipation) in ferroelectrics are one of the most critical issues for high power devices, such as therapeutic ultrasonic transducers, large displacement actuators, SONAR projectors, and high frequency medical imaging transducers. The losses of ferroelectric materials have three distinct types, i.e., elastic, piezoelectric and dielectric losses. People have been investigating the mechanisms of these losses and are trying hard to control and minimize them so as to reduce performance degradation in electromechanical devices. There are impressive progresses made in the past several decades on this topic, but some confusions still exist. Therefore, a systematic review to define related concepts and clear up confusions is urgently in need. With this objective in mind, we provide here a comprehensive review on the energy losses in ferroelectrics, including related mechanisms, characterization techniques and collections of published data on many ferroelectric materials to provide a useful resource for interested scientists and engineers to design electromechanical devices and to gain a global perspective on the complex physical phenomena involved. More importantly, based on the analysis of available information, we proposed a general theoretical model to describe the inherent relationships among elastic, dielectric, piezoelectric and mechanical losses. For multi-domain ferroelectric single crystals and ceramics, intrinsic and extrinsic energy loss mechanisms are discussed in terms of compositions, crystal structures, temperature, domain configurations, domain sizes and grain boundaries. The intrinsic and extrinsic contributions to the total energy dissipation are quantified. In domain engineered ferroelectric single crystals and ceramics, polarization rotations, domain wall motions and mechanical wave scatterings at grain boundaries are believed to control the mechanical quality factors of piezoelectric resonators. We show that a thorough understanding on the kinetic processes is critical in analyzing energy loss behavior and other time-dependent properties in ferroelectric materials. At the end of the review, existing challenges in the study and control of losses in ferroelectric materials are analyzed, and future perspective in resolving these issues is discussed.

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Section: Extrinsic Loss Mechanismsmentioning

confidence: 99%

Losses in ferroelectric materials

Liu

Zhang

Jiang

et al. 2015

Materials Science and Engineering: R: Reports

256

112

View full text Add to dashboard Cite

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“…In particular, domain rearrangement and lattice strain in large-domain electroceramic materials have been analysed under various field conditions1011, but such analyses give no insight into atomic displacements. Diffraction and imaging techniques available in a transmission electron microscope (TEM) enable single-crystal studies of field-induced phase transitions, lattice distortions, and domain rearrangement in polycrystalline materials1213; however, obtaining quantitative information on atomic displacements from TEM data is difficult.…”

mentioning

confidence: 99%

Electric-field-induced local and mesoscale structural changes in polycrystalline dielectrics and ferroelectrics

Usher

Levin

Daniels

et al. 2015

Sci Rep

Self Cite

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The atomic-scale response of dielectrics/ferroelectrics to electric fields is central to their functionality. Here we introduce an in situ characterization method that reveals changes in the local atomic structure in polycrystalline materials under fields. The method employs atomic pair distribution functions (PDFs), determined from X-ray total scattering that depends on orientation relative to the applied field, to probe structural changes over length scales from sub-Ångstrom to several nanometres. The PDF is sensitive to local ionic displacements and their short-range order, a key uniqueness relative to other techniques. The method is applied to representative ferroelectrics, BaTiO3 and Na½Bi½TiO3, and dielectric SrTiO3. For Na½Bi½TiO3, the results reveal an abrupt field-induced monoclinic to rhombohedral phase transition, accompanied by ordering of the local Bi displacements and reorientation of the nanoscale ferroelectric domains. For BaTiO3 and SrTiO3, the local/nanoscale structural changes observed in the PDFs are dominated by piezoelectric lattice strain and ionic polarizability, respectively.

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“…Two examples are polycrystalline piezoelectric materials, whose net piezoelectric effect measured at the macroscale is typically reduced due to the different contributions from randomly oriented nano-to microscopic grains, 4 and ferroelectrics, where nanoscale domains of variously orientated polarisation affect the dielectric susceptibility 5 and piezoelectric response. 6,7 In this context, the advent of atomic force microscopy (AFM) techniques and their ability to probe matter with nanometric lateral resolution has allowed the physical limits of electromechanical phenomena to be explored. [8][9][10][11][12] AFM has been instrumental in ushering in the age of nanotechnology owing to its high resolution and sensitivity across a range of interaction forces, allowing AFM to find applications in materials science, physics, chemistry, and biology.…”

Section: Introductionmentioning

confidence: 99%

“…The presence of domains in ferroelectric samples has been demonstrated to affect macroscopic properties such as the dielectric susceptibility 5 and piezoelectric response. 6,7 Therefore, understanding and controlling domain structures is key to tailoring and optimising the electronic properties of ferroelectric materials. Recently, Lichtensteiger et al have demonstrated using PFM that the insertion of a dielectric spacer layer between a ferroelectric thin film and the bottom electrode led to an increase of the depolarizing field, allowing a polydomain configuration to be tailored in samples presenting a uniform polarisation.…”

Section: Introductionmentioning

confidence: 99%

Applications of piezoresponse force microscopy in materials research: from inorganic ferroelectrics to biopiezoelectrics and beyond

Denning

Guyonnet

Rodriguez

2016

International Materials Reviews

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Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an electric field applied with the tip of an atomic force microscope. Originally developed more than two decades ago to study ferroelectric materials, this technique has since been used to probe electromechanical functionality in a wide range of piezoelectric materials including organic and biological systems. PFM has also been demonstrated as a useful tool to detect mechanical strain originating from electrical phenomena in nonpiezoelectric materials. Paralleling advances in analytical and numerical modelling, many technical improvements have been made in the last decade: switching spectroscopy PFM allows the polarisation switching properties of ferroelectrics to be resolved in real space with nanometric resolution, while dual ac resonance tracking and band excitation PFM have been used to improve the signal-to-noise ratio. In turn, these advances have led to increasingly large multidimensional data sets containing more complete information on the properties of the sample studied. In this review, PFM operation and calibration are described, and recent advances in the characterisation of electromechanical coupling using PFM are presented. The breadth of the systems covered highlights the versatility and wide applicability of PFM in fields as diverse as materials engineering and nanomedicine. In each of these fields, combining PFM with complementary techniques is key to develop future insight into the intrinsic properties of the materials as well as for device applications.

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An in situ diffraction study of domain wall motion contributions to the frequency dispersion of the piezoelectric coefficient in lead zirconate titanate

Cited by 29 publications

References 21 publications

Losses in ferroelectric materials

Losses in ferroelectric materials

Electric-field-induced local and mesoscale structural changes in polycrystalline dielectrics and ferroelectrics

Applications of piezoresponse force microscopy in materials research: from inorganic ferroelectrics to biopiezoelectrics and beyond

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