Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

Abstract

A compact high-speed X-ray atomic force microscope has been developed for in situ use in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

Structure and Nanomechanics of Model Membranes by Atomic Force Microscopy and Spectroscopy: Insights into the Role of Cholesterol and Sphingolipids

“…Limiting radiation damage is a major challenge when using very intense XR beams on soft and biological samples. For instance, the formation of micrometric holes produced by an intense XR nanobeam on a semiconducting organic thin film has lately been observed in situ by means of HS-AFM [104]. …”

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

“…The second one was installed at the ID13 beamline (ESRF), in a normal incidence configuration, and is compatible with the use of a sub-micrometric X-ray beam. 13 Here we report a novel prototype of X-AFM compatible with a soft X-ray beamline in a normal incidence working scheme and operating inside a high vacuum chamber. In this frame, our instrument is partially similar to the setup installed at the nanoXAS beamline at SLS.…”

“…The second one was installed at the ID13 beamline (ESRF), in a normal incidence configuration, and is compatible with the use of a sub-micrometric X-ray beam. 13…”