2008
DOI: 10.1107/s0909049508001696
|View full text |Cite
|
Sign up to set email alerts
|

An extraction algorithm for core-level excitations in non-resonant inelastic X-ray scattering spectra

Abstract: Non-resonant inelastic X-ray scattering of core electrons is a prominent tool for studying site-selective, i.e. momentum-transfer-dependent, shallow absorption edges of liquids and samples under extreme conditions. A bottleneck of the analysis of such spectra is the appropriate subtraction of the underlying background owing to valence and core electron excitations. This background exhibits a strong momentum-transfer dependence ranging from plasmon and particle-hole pair excitations to Compton scattering of cor… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

2
42
0
1

Year Published

2008
2008
2022
2022

Publication Types

Select...
8
1
1

Relationship

2
8

Authors

Journals

citations
Cited by 49 publications
(45 citation statements)
references
References 33 publications
2
42
0
1
Order By: Relevance
“…Incident energy selectivity was accomplished with a double-bounce Si(111) monochromator, providing ~1.4 eV FWHM energy resolution. Spectrometer operation and performance were consistent with previous work [21,25,31,32]. EELS measurements were acquired using a TITAN electron microscope with a monochromatic electron.…”
Section: Methodsmentioning
confidence: 89%
“…Incident energy selectivity was accomplished with a double-bounce Si(111) monochromator, providing ~1.4 eV FWHM energy resolution. Spectrometer operation and performance were consistent with previous work [21,25,31,32]. EELS measurements were acquired using a TITAN electron microscope with a monochromatic electron.…”
Section: Methodsmentioning
confidence: 89%
“…Final XRS spectra were normalized to the integral intensity between 531 eV and 555 eV. Details of the data processing and analysis can be found in a study by Sternemann et al (58). Because we could observe the sample during the experiment through a microscope, we can exclude any sample damage due to the X-ray exposure.…”
Section: Methodsmentioning
confidence: 99%
“…The separation of the XRS signal from the larger Compton background is a key experimental difficulty in all XRS measurements 16,27 . The valence Compton backgrounds are approximated by fitting the pre-edge data to standard Compton forms and using the low-q limit XRS form as a reference 26 .…”
mentioning
confidence: 99%