An external cavity diode laser sensor

Miles, R. O.; Dandridge, A.; Tveten, A. B.; Giallorenzi, T. G.

doi:10.1109/jlt.1983.1072104

Cited by 23 publications

(8 citation statements)

References 21 publications

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“…The use of external cavity laser for precise displacement measurement has a long history (Miles et al 1983;Lang & Kobayashi 1980) using traditional technology. In such configuration (cf.…”

Section: Vibration/acceleration Sensor With Very-short External Cavitmentioning

confidence: 99%

Of light, of MEMS: Optical MEMS in telecommunications and beyond

Chollet

Liu

Ashraf

et al. 2009

Sadhana

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The burst of the Internet bubble in 2000 has severely quenched the pace of development in the optical MEMS field. However, it is now clear that this field is again set to move forward as not only telecommunication but many other industries are benefiting from its application. We describe in this paper some of our latest achievements in the field, showing a new type of small scale optical switch based on integrated optics, a vibration/acceleration sensor using a veryshort external cavity laser and finally, the early development result of a nano-scale tunable photonic crystal that could be used for beam steering. The diversity of the applications we demonstrate, is a clear testimony that there is indeed 'plenty of room at the bottom'-and particularly in the natural combination of Light and MEMS!

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“…The use of external cavity laser for precise displacement measurement has a long history (Miles et al 1983;Lang & Kobayashi 1980) using traditional technology. In such configuration (cf.…”

Section: Vibration/acceleration Sensor With Very-short External Cavitmentioning

confidence: 99%

Of light, of MEMS: Optical MEMS in telecommunications and beyond

Chollet

Liu

Ashraf

et al. 2009

Sadhana

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“…The SMI effect is explained by a model of the external-cavity laser diode 8,[23][24][25] shown in Fig. 1͑b͒.…”

Section: Smi Signalmentioning

confidence: 99%

“…This PD can be used for detecting the self-mixing signal. With a simply constructed optical system, the self-mixing effect has been applied to many kinds of optical sensors 7,8 and Doppler velocimeters. [9][10][11] The signal obtained by the self-mixing effect is a kind of interference signal and is called the self-mixing interference ͑SMI͒ signal.…”

Section: Introductionmentioning

confidence: 99%

Self-mixing type of phase-locked laser diode interferometer

et al. 1999

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A new type of phase-locked laser diode interferometer that uses self-mixing interference in the optical system is described. The selfmixing interference (SMI) signal is obtained easily by optical feedback, i.e., feeding back the laser beam from the object to the laser diode (LD). The SMI signal can be detected by a photodiode in the package of the LD. Therefore, a beamsplitter, reference mirror, and external photodetector are not required, and an interference signal is obtained using a simple optical system. Although the mechanism of SMI is completely different from that of conventional interference, it is shown that the response of the SMI signal to phase changes is the same as that of conventional interference. We used the phase-locked technique to fix the phase change and demonstrated measurement of absolute distance and displacement.

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“…10 A technique based on laser diode feedback is limited by laser intensity noise to 2ϫ10 Ϫ4 Å rms /ͱHz. 17,18 The beam diffraction technique is a factor of 1.6 -28 worse than these methods. However, the beam diffraction technique is simpler and more practical to implement in near-field microscopes than any of the above methods.…”

Section: Minimum Detectable Displacement In Near-field Scanning Opticmentioning

confidence: 99%

Minimum detectable displacement in near-field scanning optical microscopy

Froehlich

Milster

1994

Applied Physics Letters

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The probe-to-sample separation in near-field scanning optical microscopes can be regulated by a noncontact atomic shear force sensing scheme that allows simultaneous acquisition of optical and shear force images. We have measured the minimum detectable displacement that can be achieved with a scheme based on diffracting a focused laser beam from the vibrating probe. The minimum detectable displacement determines the smallest resolvable change in force acting on the probe. The measured shot-noise-limited value is 2.8×10−3 Årms/√Hz, and the practical sensitivity is limited by thermal vibration noise to 7×10−3 Årms/√Hz. These values compare well with those calculated theoretically.

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An external cavity diode laser sensor

Cited by 23 publications

References 21 publications

Of light, of MEMS: Optical MEMS in telecommunications and beyond

Of light, of MEMS: Optical MEMS in telecommunications and beyond

Self-mixing type of phase-locked laser diode interferometer

Minimum detectable displacement in near-field scanning optical microscopy

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