2014
DOI: 10.1016/j.ssc.2014.01.028
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An extended Hückel study of the electronic properties of III–V compounds and their alloys

Abstract: In this work, we performed tight binding calculations of the electronic structure of III-V semiconductors compounds and their alloys based on the Extended Hückel Theory (EHT), where the Hückel parameters for the binary compounds were generated following a simulated annealing procedure. In particular, this article is focused on the dependency between band gap and the applied pressure and also the alloy composition.

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Cited by 12 publications
(12 citation statements)
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“…As in any TB formalism, the EHT alloy states are spanned as linear combinations of atomic orbitals, considering that the basis orbitals form a non-orthogonal basis set. The aforementioned method presents a good transferability of its parameters [5] and it also gives a good description of the deformation potential for III-V alloys under uniform strain [6]. In addition, EHT is capable of reproducing the density of states (DOS) of graphene, silicene and germanene supercells with a single vacancy, in a remarkble agreement with Density Functional Theory (DFT) calculations [7].…”
Section: Introductionmentioning
confidence: 75%
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“…As in any TB formalism, the EHT alloy states are spanned as linear combinations of atomic orbitals, considering that the basis orbitals form a non-orthogonal basis set. The aforementioned method presents a good transferability of its parameters [5] and it also gives a good description of the deformation potential for III-V alloys under uniform strain [6]. In addition, EHT is capable of reproducing the density of states (DOS) of graphene, silicene and germanene supercells with a single vacancy, in a remarkble agreement with Density Functional Theory (DFT) calculations [7].…”
Section: Introductionmentioning
confidence: 75%
“…An acceptable set is generated when y ≤ 0.15 eV. This approach was successful for generating acceptable and highly transferable TB sets for few III-V semiconductors compounds (AlAs, GaAs, InAs and GaP) [6], as well and group-IV planar structures such as graphene, silicene and germanene [7].…”
Section: Simulation Annealing Proceduresmentioning
confidence: 99%
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