An experimentally convenient configuration for electron channeling contrast imaging

Simkin, B.A.; Crimp, M. A.

doi:10.1016/s0304-3991(99)00009-1

Cited by 83 publications

(61 citation statements)

References 9 publications

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“…It was reported that the image contrast is optimised at the condition s ⇡ 0 [60], and changes rapidly when s become negative [61]. Simulation work by Wilkinson [58] shows that the stress relaxation of a dislocation close to the crystal surface would only give minor e↵ects on the electron channelling contrast image.…”

Section: Literature Reviewmentioning

confidence: 99%

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The defect evolution in shock loaded tantalum single crystals

et al. 2018

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Section: Literature Reviewmentioning

confidence: 99%

“…However, ECCI still has some limitations. Unlike TEM, ECCI of dislocations is only optimised with s = 0, and image contrast falls o↵ rapidly with both positive and negative deviations from the perfect Bragg condition [60].…”

Section: Literature Reviewmentioning

confidence: 99%

The defect evolution in shock loaded tantalum single crystals

et al. 2018

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“…In addition, inspecting large area of flat surface could ensure the representativeness of the specimen. It is important to meet the exact Bragg-diffraction condition in order to distinguish dislocation lines from the background matrix (Simkin & Crimp, 1999). In the SEM, there are two approaches to achieve this condition.…”

Section: Introductionmentioning

confidence: 99%

Optimal Conditions for Defect Analysis Using Electron Channeling Contrast Imaging

Yang

2016

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Electron channeling contrast imaging (ECCI) is a powerful analyzing tool for identifying lattice defects like dislocations and twin boundaries. By using diffraction-based scanning electron microscopy technique, it enables microstructure analysis, which is comparable to that obtained by transmission electron microscopy that is mostly used in defect analysis. In this report, the optimal conditions for investigating crystal defects are suggested. We could obtain the best ECCI images when both acceleration voltage and probe current are high (30 kV and 20 nA). Also, shortening the working distance (6 mm) enhances the quality of defect imaging.

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“…ECCI can be performed in either the backscatter geometry (sample at approximately 90 to the impinging electron beam with the backscattered electrons detected by an electronsensitive diode or diodes placed under the pole piece of the microscope) or forescatter geometry (sample is tilted between 30 and 70 to the impinging electron beam and the forescattered electrons detected by a diode placed in front of the sample). 28,31 The forescatter geometry provides better signal to noise when compared to the backscattered geometry. Detailed reviews on ECCI which discuss the relative advantages and disadvantages of the forescatter and the backscatter geometries are given by Wilkinson and Hirsch 32 and Simpkin and Crimp.…”

mentioning

confidence: 99%

“…Detailed reviews on ECCI which discuss the relative advantages and disadvantages of the forescatter and the backscatter geometries are given by Wilkinson and Hirsch 32 and Simpkin and Crimp. 31 It is also necessary to use a detection system that allows discrimination between those electrons leaving the sample which carry channeling information and those which have been diffusely scattered by the sample.…”

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confidence: 99%

Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

Naresh-Kumar

Mauder

Wang

et al. 2013

Applied Physics Letters

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An experimentally convenient configuration for electron channeling contrast imaging

Cited by 83 publications

References 9 publications

The defect evolution in shock loaded tantalum single crystals

The defect evolution in shock loaded tantalum single crystals

Optimal Conditions for Defect Analysis Using Electron Channeling Contrast Imaging

Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

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