An examination of the optical dielectric tensor of a liquid crystal waveguide

Ellipsometric depth profiling of the refractive index: a neural network method and its application to a surface-induced inhomogeneity in a liquid crystal

“…Although we have focused here on a rather specialized experimental application of ellipsometric depth profiling, it is clear that the strategy followed can easily be adopted for refractive-index depth profiling from the nanometre to the micrometre range in technologically important cases such as ion-implanted silicon, surface oxidization and coated glass. The presented method can also help to resolve some issues in ferroelectric liquid crystal [12,13] and waveguide [30,31] applications.…”

“…Ellipsometry, the analysis of the polarization after reflection or transmission of light, is an important tool for depth profiling of the refractive index of optically inhomogeneous materials. Applications based on the retrieval of optical material properties from ellipsometric data are abundant in many fields of research [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. In semiconductor technology, for example, it is important to estimate the depth profile of the structural damage or concentration of impurities caused by ion implantation, oxidization or chemical treatment.…”

Testing the dynamic theory of nematics using fully-leaky guided modes and a convergent beam system

“…The next mode would have a zero at the cell centre and would be sensitive to the director at points one quarter way through the cell and three quarters through the cell. Over the past fifteen years the use of this waveguide probing technique for determining the director profile for a range of liquid crystal cell configurations has been established [14][15][16][17][18][19]. However only in the last few years, following the implementation of the fully-leaky waveguide procedure [19] have standard commercial cells been amenable to study using these powerful optical techniques.…”

Guided mode studies of liquid crystal layers

“…This fully-leaky geometry has also been used to explore the director alignment in SSFLC cells [51,52]. A typical set of reflectivity data, compared with a multi-layer optics model is shown in Figure 16.13 <Figure 16.13>.…”