An Evaluation of the Use of X-ray Residual Stress Determination as a Means of Characterizing Oxidation Damage of Nickel-Based, Cr2O3-Forming Superalloys Subjected to Various Oxidizing Conditions

Abstract

The use of X-ray residual stress determination as a technique for evaluating the damage incurred by nickel-based, Cr 2 O 3 -forming superalloy materials under various service conditions (isothermal heating, thermal cycling, applied stress, stressed and cycled) was investigated. Large and small compressive residual stresses were observed for the oxides and the near surface substrates, respectively. It was expected that the applied stresses and thermal cycling would cause an enhanced degree of oxidation damage that would translate into appreciable differences in residual stress values. Differences in the magnitude of residual stress values were not appreciable condition-to-condition, however. An increase in the severity of the oxidizing conditions in the form of longer oxidation times, higher oxidizing temperatures, and a much greater frequency of thermal cycling is suggested for future studies.

Stress and Adhesion of Protective Oxide Scales on Stainless Steels and RE Effects

“…Previously, an attempt was made to estimate the elastic energy of a scale at high temperature using stress measurements at room temperature. [18][19][20] However the estimation at room temperature was unreliable because the scale fails and creep deformation occurs at elevated temperatures. There were many attempts to characterize scale failure during cooling using an AE technique, 21,22) which is very sensitive, even at high temperature.…”

Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

“…In Table I, a non-exhaustive bibliographical synthesis of several works concerning stress measurements based on those two techniques is given. [7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23] It can be seen that even if the first works starting in 1986 are based on XRD, Raman spectroscopy has become the main technique to measure residual stresses today. However, to our knowledge, these two techniques have not been systematically used together to study residual stresses in the same thermal oxide/ metal system.…”

Measurement of the Stress in Oxide Scales Developed Upon Oxidation of a Pt‐Based Alloy in Air at 1250°C

“…14 Information on the strain can be obtained from the interplanar spacing variations 15 , while the sin2w method can be used to determine the stresses. 14,[16][17][18][19] The parameter variations can be obtained from the following expression for an isotropic material 17 :…”

“…Another approach is the curvature technique, which allows for determination of the stress distribution in the scale and in the underlying substrate only at the room temperature . XRD is another common technique that has been used for stress and strain determination in situ and ex situ . Information on the strain can be obtained from the interplanar spacing variations, while the sin2ψ method can be used to determine the stresses .…”

“…XRD is another common technique that has been used for stress and strain determination in situ and ex situ . Information on the strain can be obtained from the interplanar spacing variations, while the sin2ψ method can be used to determine the stresses . The parameter variations can be obtained from the following expression for an isotropic material: …”