An Evaluation of the Magnetic Field Characteristics for the Probe Position and Temperature using the Multi-Output MOSFET Sensor by 0.18 µm CMOS Process

Suzuki, Shinya; Harada, Tomochika

doi:10.1541/ieejsmas.143.300

IEEJ Trans. SM

2023

DOI: 10.1541/ieejsmas.143.300

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An Evaluation of the Magnetic Field Characteristics for the Probe Position and Temperature using the Multi-Output MOSFET Sensor by 0.18 µm CMOS Process

Shinya Suzuki,

Tomochika Harada

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An Evaluation of the Magnetic Field Characteristics for the Probe Position and Temperature using the Multi-Output MOSFET Sensor by 0.18 µm CMOS Process

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References 7 publications

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