“…Neither is it revealed by the ξ ( T ) dependence that, as mentioned above, reflects the T dependence of the dose rate effect, also studied previously in traditional measurements with continuous ion beams (or unintentionally scanned beams due to rastering) 13 15 . A special role of T ~ 100 °C has, however, been noted in a number of previous studies of all three main polymorphs of SiC: 4 H -SiC 14 , 6 H -SiC 22 23 24 25 , and 3 C -SiC 26 27 28 29 , evidenced either as the onset of post-irradiation defect annealing 22 23 24 26 27 28 , as a rapid decrease in the cross-section of damage production 25 , as a qualitative change in the radiation resistance of nanocrystalline SiC 29 , or as a maximum of the concentration of open-volume defects monitored by positron annihilation spectroscopy 14 . The non-monotonic τ ( T )-dependence of Fig.…”