2018
DOI: 10.1109/tr.2018.2834828
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An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors

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Cited by 12 publications
(9 citation statements)
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“…In [133], a health state identification method for IGBTs based on self-organizing maps (SOMs) is proposed. It is essentially a clustering task.…”
Section: A Condition Monitoringmentioning
confidence: 99%
“…In [133], a health state identification method for IGBTs based on self-organizing maps (SOMs) is proposed. It is essentially a clustering task.…”
Section: A Condition Monitoringmentioning
confidence: 99%
“…In [132], a health state identification method for IGBTs based on self-organizing maps (SOMs) is proposed. It is essentially a clustering task, where the states of the device are clustered as the healthy state, the partially degraded state, the heavily degraded state, and the failure state considering the distance between the input measurements (including collector current I c , collector-emitter voltage V ce , and case temperature T ) and the best matching unit of the trained SOMs.…”
Section: A Condition Monitoringmentioning
confidence: 99%
“…The prediction method is the key technique in the RUL analysis. Although some lifetime models are proposed for RUL prediction [32][33][34][35][36][37][38], the data-driven methods are obviously advanced in dealing with this kind of problem with huge historic data [39][40][41][42][43][44]. In recent years, the data-driven methods in condition estimation and prediction have developed very fast, thanks to the progress of AI and high performance programing chips [45][46][47][48][49][50][51].…”
Section: Introductionmentioning
confidence: 99%