Component single-event upset (SEU) rates are used to model and predict system bit-error rate (BER) performance in trade and specification verification analyses. Simplifying trade studies involving component cost, delivery-time reductions, and part substitution effects are important benefits.Index Terms-Bit-error rate (BER), bit-error-rate (BER) specifications, bit-error-rate (BER) verification methods, component trades, image processing, ionizing radiation, radiation effects, single-event effects (SEEs), single-event functional interrupts (SEFIs), soft-error rate (SER).