An ellipsometric study of poly(3,4-ethylenedioxythiophene) electrosynthesis – from the initial stages to thick layers formation

Improved Potentiometric and Optic Sensitivity of Polyaniline Film to Dissolved Oxygen by Incorporating Iron‐Porphyrin

“…The optical data obtained during this characterization gives us important information about the maximum range of grayscale values which can be obtained with the modified electrode and indicates the optimal potential range for DO detection. Figure 4 B shows a hysteresis between the anodic (forward) and cathodic (backward) scans, which can be attributed to the structural and morphologic modifications that all conducting polymers suffer during their redox processes 32,35,36; Since the redox conversion of any polymer film involves mechanical deformation of the matrix (with simultaneous intake and/or expulsion of solvent and counter‐ions), high activation overpotentials are required both for oxidation as well as for reduction, resulting in a significant redox hysteresis. In the absence of oxygen the grayscale values are at a maximum when the modified electrode is in its reduced state.…”

Corrosion of silver alloys in sulphide environments: a multianalytical approach for surface characterisation

“…The complex index of refraction (ñ ¼ n À ik, n being the real part of the refractive index and k the extinction coefficient) of the corrosion product, as well as its thickness, are computed based on the best t of the theoretical and experimental data. 48 The two-layer model (one homogeneous layer coating on a semi-innite homogeneous substrate) employed to describe the samples was found to be appropriate to evaluate n, k and the thickness of the samples exposed to the corroding medium for up to 3 min. It is evident from Fig.…”

Switching of the ion exchange behaviour of PEDOT thin films during a potential cycling: An electrochemical atomic force microscopy study

“…Raman spectroscopy [28] and Electrochemical Impedance Spectroscopy (EIS) [29][30] are able to provide thickness values when applied on ECPs in-situ but their interpretation is model dependant and they do not offer a time resolution well adapted to this kind of measurements. Ellipsometry could be an interesting technique for this purpose but only in the case of films whose thickness is lower than about 1 µm [31][32]. Scanning ElectroChemical Microscopy (SECM), ElectroChemical Scanning Tunneling Microscopy [27] and Scanning Ion Conductance Microscopy [33] are powerful scanning probe microscopy techniques that allow in-situ measurements of thickness variation of ECPs thin films during electrochemical conditioning with simultaneously very satisfying time and spatial (vertical) resolutions.…”