An Electrooptothermal-Coupled Circuit-Level Model for VCSELs Under Pulsed Condition

Yan, Junkai; Wang, Jianguo; Tang, Chuanxiang; Liu, Xiaolong; Zhang, Gengqing; He, Yanyang

doi:10.1109/tie.2018.2833043

Cited by 9 publications

(7 citation statements)

References 27 publications

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“…Performance degradation due to these factors is monotonic and irreversible. The output light power decreases with time, and when the light power decreases by 20%, we determine VCSELs to be ineffective [3]. In this paper, from the degradation of the data from the literature [5], using the above model, we analyze the reliability of the vertical cavity surface emitting lasers.…”

Section: Residual Life Predictionmentioning

confidence: 99%

“…The reliability of the laser is becoming increasingly important with the application prospects of lasers becoming increasingly extensive. The research on the lifetime and reliability of VCSELs is becoming a new focus, especially in recent years, with the increasing output power and electro-optical conversion efficiency of semiconductor lasers [3].…”

Section: Introductionmentioning

confidence: 99%

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Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Luo

2020

IEEE Access

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Due to the long life and high reliability of vertical cavity surface-emitting lasers, the performance degradation experiment cost is high, and the experiment cycle is long, because the degradation failure process of a semiconductor laser is a monotonic decreasing process, and the amount of performance degradation is independent for each function. Therefore, based on the Gamma process, the degradation performance of vertical cavity surface-emitting lasers has been modeled and analyzed in this paper. First, a model is given based on the Gamma process. Then, the failure distribution of the product is determined by analyzing the first arrival time distribution of the process, and then, the reliability of the product is statistically deduced to determine the residual life distribution of the device. Finally, combined with the data obtained from accelerated aging experiments, the product failure time of 261 470 hours is deduced, approximately 30 years. The model is in good agreement with the experimental results, which proves the validity of the model and provides a theoretical basis for the analysis of the reliability of the vertical cavity surface-emitting laser. According to the model, the reliability of the device decreases to 0.9994 after 100 000 hours of operation.

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Section: Residual Life Predictionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Luo

2020

IEEE Access

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“…This work is an extension of [4] and examples of recent similar works on this topic can be found in [5], [6], [7], [8]. This work together with [5] include the additional use of two sub-circuits to keep track of the free carriers in the barrier regions and in the QWs.…”

Section: Introductionmentioning

confidence: 97%

Large-Signal Equivalent Circuit for Datacom VCSELs

Grabowski

Gustavsson

et al. 2021

J. Lightwave Technol.

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Increasing the baud rate in optical interconnects (OIs) will require the use of more sophisticated driver and receiver electronics. This will help overcome the stagnated bandwidth of the Vertical-Cavity Surface-Emitting Laser (VCSEL) and the pin-photodetector. Next generation OIs operating at single lane rates of 50+ Gbaud will therefore require careful co-optimization of the electronics and the optoelectronics. To facilitate this work there is a need of an accurate equivalent circuit for the optoelectronic components, functioning over a broad drive current and ambient temperature range. The VCSEL is the most important and complex to model due to its nonlinear behavior and strongly varying characteristics with drive current and ambient temperature. For this purpose, a large-signal equivalent circuit dedicated for high-speed datacom VCSELs has been developed and is presented here. The distributed electrical parasitics in the device layout are carefully considered, the intrinsic speed limitation from carrier transport effects in the Separate-Confinement-Heterostructure (SCH) and the carrierphoton interaction in the Quantum Wells (QWs) are included, and self-heating effects in the device are monitored. The circuit is purposely based on physical instead of empirical models so that it can provide usable feedback to VCSEL designers. For circuit demonstration, it is implemented in Keysight's Advanced Design System (ADS) software and thereafter applied to replicate the performance of a state-of-the-art 28-GHz-bandwidth VCSEL at different temperatures and drive currents. Comparison is made between simulated and measured steady-state characteristics, small-signal behavior, and large-signal response under 28 Gbaud On-Off-Keying (OOK) and Pulse-Amplitude-Modulation 4 (PAM4) modulation, showing good agreement.

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“…In this paper, based on the previous study [14][15][16] , the electro-optical transient response characteristics of VCSEL arrays are further studied and analyzed, and the Simulink model of the rate equation of VCSEL arrays under RLC oscillatory pulse current injection is established using the equivalent circuit of VCSEL arrays, and the main factors affecting the electrooptical transient response of VCSEL arrays are derived through experimental verification and analysis. The main factors affecting the electro-optical transient response of VCSEL arrays are experimentally verified and analyzed.…”

Section: Introductionmentioning

confidence: 99%

Electro-optical transient response study of pulsed VCSEL arrays

Wenxuan,

Xiaoyu,

Yan

et al. 2023

3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023)

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Vertical cavity surface emitting laser (VCSEL) array is the important laser source in LiDAR ranging systems (LiDAR). The VCSEL array have important effects on the electro-optical transient response characteristics and power density for time-of-flight ToF ranging technology. In this study, by using the carrier-photon coupling equation of semiconductor lasers, we established a Simulink model of the rate equation of pulsed VCSEL arrays, an equivalent circuit model and a heat dissipation model of VCSELs. We analyzed the factors affecting the electro-optical transient response of pulsed VCSEL arrays theoretically. Then we verified the result experimentally. In this paper, the effects of array size and spurious parameters on the electro-optical delay time and optical pulse rise time of VCSEL arrays are discussed.Both simulation and experimental results show that the rise time of the VCSEL array decreases and then increases as the size of the array increases in the narrow pulse driving circuit. This provides a light source optimization scheme for the application of VCSEL arrays in LiDAR ranging systems (LiDAR). It also provides a theoretical basis for the in-depth study of VCSEL arrays under pulse driving.

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An Electrooptothermal-Coupled Circuit-Level Model for VCSELs Under Pulsed Condition

Cited by 9 publications

References 27 publications

Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Large-Signal Equivalent Circuit for Datacom VCSELs

Electro-optical transient response study of pulsed VCSEL arrays

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