Abstract:Resistive random access memories (RRAMs) can be programmed to discrete resistive levels on demand via voltage pulses with appropriate amplitude and widths. This tuneability enables the design of various emerging concepts, to name a few: neuromorphic applications and reconfigurable circuits. Despite the wide interest in RRAM technologies there is still room for improvement and the key lies with understanding better the underpinning mechanism responsible for resistive switching. This work presents a methodology … Show more
“…Our functionality testing is concluded with temperature dependent voltage cycling that can provide insights into the conduction mechanisms governing the switching in the DUT. This can be performed by considering the switching (supra-threshold) and the non-switching (sub-threshold) regimes of operation 9 .Figure 1An overview of the proposed characterisation procedure introduced in this paper. Testing is split to four modules depending on their particular scope.…”
The emergence of memristor technologies brings new prospects for modern electronics via enabling novel in-memory computing solutions and energy-efficient and scalable reconfigurable hardware implementations. Several competing memristor technologies have been presented with each bearing distinct performance metrics across multi-bit memory capacity, low-power operation, endurance, retention and stability. Application needs however are constantly driving the push towards higher performance, which necessitates the introduction of a standard benchmarking procedure for fair evaluation across distinct key metrics. Here we present an electrical characterisation methodology that amalgamates several testing protocols in an appropriate sequence adapted for memristors benchmarking needs, in a technology-agnostic manner. Our approach is designed to extract information on all aspects of device behaviour, ranging from deciphering underlying physical mechanisms to assessing different aspects of electrical performance and even generating data-driven device-specific models. Importantly, it relies solely on standard electrical characterisation instrumentation that is accessible in most electronics laboratories and can thus serve as an independent tool for understanding and designing new memristive device technologies.
“…Our functionality testing is concluded with temperature dependent voltage cycling that can provide insights into the conduction mechanisms governing the switching in the DUT. This can be performed by considering the switching (supra-threshold) and the non-switching (sub-threshold) regimes of operation 9 .Figure 1An overview of the proposed characterisation procedure introduced in this paper. Testing is split to four modules depending on their particular scope.…”
The emergence of memristor technologies brings new prospects for modern electronics via enabling novel in-memory computing solutions and energy-efficient and scalable reconfigurable hardware implementations. Several competing memristor technologies have been presented with each bearing distinct performance metrics across multi-bit memory capacity, low-power operation, endurance, retention and stability. Application needs however are constantly driving the push towards higher performance, which necessitates the introduction of a standard benchmarking procedure for fair evaluation across distinct key metrics. Here we present an electrical characterisation methodology that amalgamates several testing protocols in an appropriate sequence adapted for memristors benchmarking needs, in a technology-agnostic manner. Our approach is designed to extract information on all aspects of device behaviour, ranging from deciphering underlying physical mechanisms to assessing different aspects of electrical performance and even generating data-driven device-specific models. Importantly, it relies solely on standard electrical characterisation instrumentation that is accessible in most electronics laboratories and can thus serve as an independent tool for understanding and designing new memristive device technologies.
“…The MIM devices are initially electroformed for demonstrating hysteretic characteristics and bipolar behaviour as per, and brought to a resistive level between 25 and 300 kΩ. Electrical characteristics for this class of devices and at similar resistive ranges has been presented elsewhere 21 , 28 , 29 . For this process the device is subjected to consecutive 10–100 μs pulses of negative polarity ranging from − 3 to − 8 V with a 0.25 V voltage step.…”
There is an increasing interest for alternative ways to program memristive devices to arbitrary resistive levels. Among them, light-controlled programming approach, where optical input is used to improve or to promote the resistive switching, has drawn particular attention. Here, we present a straight-forward method to induce resistive switching to a memristive device, introducing a new version of a metal-oxide memristive architecture coupled with a UV-sensitive hybrid top electrode obtained through direct surface treatment with PEDOT:PSS of an established resistive random access memory platform. UV-illumination ultimately results to resistive switching, without involving any additional stimulation, and a relation between the switching magnitude and the applied wavelength is depicted. Overall, the system and method presented showcase a promising proof-of-concept for granting an exclusively light-triggered resistive switching to memristive devices irrespectively of the structure and materials comprising their main core, and, in perspective can be considered for functional integrations optical-induced sensing.
“…To ensure the device is in the non‐switching voltage regime, the data points were extracted from the positive branch of the I–V scans. [ 47 ] It can be noticed that the conductivity of the devices is almost constant (within experimental error) in the range 243–293 K; however, at higher voltages, a small decrease of conductivity can be observed with increasing temperature. As indicated by the XRD measurements, at room temperature cations were strongly disordered, yielding a flexible structure that may affect the electronic transport within the material.…”
Memristors, being prospective work‐horses of future electronics offer various types of memory (volatile and nonvolatile) along with specific computational functionalities. Further development of memristive technologies depends on the availability of suitable materials. These materials should be easily available, stable, and preferably of low toxicity. Commonly used materials are lead halide perovskites, however, they are highly toxic and unstable under ambient conditions. Therefore a novel material is developed on the basis of bismuth iodide. In reaction with butylammonium iodide, it yields a novel compound, butylammonium iodobismuthate (BABI). Here, a diffusive memristor is introduced based on this compound and evaluates its memristive and neuromorphic properties. In contrast to nonvolatile memristors, the BABI memristors exhibit diffusive dynamics, which enable them to store the information only for short periods of time. This property is utilized to mimic the short‐term synaptic plasticity described by the leaky integrate‐and‐fire model of a biological neuron. Combined with high switching uniformity and self‐rectifying behavior, these devices show high classification accuracy for MNIST handwritten datasets, paving the way for their application in neuromorphic computing systems.
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