An efficient reliability evaluation approach for system-level design of embedded systems

Israr, Adeel; Shoufan, Abdulhadi; Huss, Sorin A.

doi:10.1109/isqed.2009.4810317

Cited by 2 publications

(2 citation statements)

References 9 publications

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“…In contrast, the work at hand proposes a generalized early quantification heuristic that even outperforms the approach from [6]. In [9], the approach from [8] is extended by using a specific variant of BDDs which perform better for the considered test cases but are still suffering from the drawbacks of common BDDs.…”

Section: Related Workmentioning

confidence: 99%

Towards scalable system-level reliability analysis

Glas

Lukasiewycz

Haubelt

et al. 2010

Proceedings of the 47th Design Automation Conference

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State-of-the-art automatic reliability analyses as used in system-level design approaches mainly rely on Binary Decision Diagrams (BDDs) and, thus, face two serious problems:(1) The BDDs exhaust available memory during their construction and/or (2) the final size of the BDDs is, sometimes up to several orders of magnitude, larger than the available memory. The contribution of this paper is twofold: (1) A partitioning-based early quantification technique is presented that aims to keep the size of the BDDs during construction at minimum. (2) A SAT-assisted simulation approach aims to deliver approximated results when exact analysis techniques fail because the final BDDs exhaust available memory. The ability of both methods to accurately analyze larger and more complex systems than known approaches is demonstrated for various test cases.

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Section: Related Workmentioning

confidence: 99%

Towards scalable system-level reliability analysis

Glas

Lukasiewycz

Haubelt

et al. 2010

Proceedings of the 47th Design Automation Conference

View full text Add to dashboard Cite

show abstract

“…The first one overcomes the second disadvantage only, whereas the second method results in just an approximate calculation of reliability values. In [10] and [11] we presented a scheme for system-level design considering reliability as the main design parameter. A data structure termed as system error decision diagram (SEDD), which models both permanent and transient errors, was presented, while considering nonfail silent resources.…”

Section: Introductionmentioning

confidence: 99%

Reliable system design using decision diagrams in presence of hard and soft errors

Israr

Huss

2014

Proceedings of 2014 11th International Bhurban Conference on Applied Sciences &Amp; Technology (IBCAST) Islamabad, Pakistan, 14

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Hard and soft errors are inherently different in property and effect on the functionality of systems. Utilizing this fact, a new reliability model is developed, i.e., "lifetime reliability", which considers both hard and soft errors occurring in information processing systems.Based on an introduction of System Decision Diagrams a couple of new data structures denoted as System Resource Decision Diagram and System Task Instance Decision Diagram, respectively, are proposed. The first data structure deals with the hard errors occurring in the system, whereas the second one represents the effects soft errors have on the system's functionality. Together, these data structures help calculate the lifetime reliability of the system they are representing. Both the construction of this diagram pair and the memory-aware evaluation of the reliability based on it are detailed in an algorithmic way. The error model representation and the reliability quantification approach are aimed to be employed in a high-level design process to accelerate exploration of design space.The proposed method is illustrated for a number of benchmarks taken from published papers. The achieved results demonstrate that this novel approach is highly memory efficient and at the same time accurate as compared to previous known schemes. Index Terms-SystemDecision Diagrams, zero-suppressed decision diagram, hard error, soft error, system-level design, embedded system, reliability evaluation

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An efficient reliability evaluation approach for system-level design of embedded systems

Cited by 2 publications

References 9 publications

Towards scalable system-level reliability analysis

Towards scalable system-level reliability analysis

Reliable system design using decision diagrams in presence of hard and soft errors

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