An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits

Zhai, Jinyuan; Yan, Changhao; Wang, Sheng-Guo; Zhou, Dian

doi:10.1109/dac.2018.8465791

2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC) 2018

DOI: 10.1109/dac.2018.8465791

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An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits

Jinyuan Zhai¹,

Changhao Yan²,

Sheng-Guo Wang³

et al.

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An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits

Cited by 1 publication

References 9 publications

High-Dimensional Yield Estimation Using Shrinkage Deep Features and Maximization of Integral Entropy Reduction

High-Dimensional Yield Estimation Using Shrinkage Deep Features and Maximization of Integral Entropy Reduction

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