Abstract:Design for testability (DFT) is a technique, which facilitates a design to become testable after fabrication. As the technology node is shrinking, complexity of the system-on-chip (SoC) becomes high and inserting DFT and verifying its timing becomes complex. For these complex SoC, generating DFT timing constraints becomes difficult in shift mode and the time required for the generation of these timing constraints is also more. A new methodology proposed to overcome these issues. The main objective of this work… Show more
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