An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

Krolak, D.; Plojhar, Jan; Horsky, Pavel

doi:10.1109/temc.2019.2958926

Cited by 6 publications

(6 citation statements)

References 14 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…IEC 61967-4 describes another method for measuring the conducted electromagnetic emission (EME) of ICs by using a 1Ω resistive probe to measure RF current and a 150Ω coupling network to measure RF voltage [36].The workbench faraday cage is another technique for conducting RF immunity and emission quantifications in a small space without the need for large anechoic chamber [37]. Magnetic probe method is another standard for emission measurement [38]. It specifies a procedure for measuring RF currents on the pins of an IC using a miniature magnetic probe and non-contact current calculation [39].…”

Section: Measurement Methods For Emc Predictionmentioning

confidence: 99%

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

Baba

Mustapha²,

Hasbullah³

2022

IJEECS

View full text Add to dashboard Cite

The proper function of the integrated circuit (IC) in an inhibiting electromagnetic environment has always been a serious concern throughout the decades of revolution in the world of electronics, from disjunct devices to today’s integrated circuit technology, where billions of transistors are combined on a single chip. The automotive industry and smart vehicles in particular, are confronting design issues such as being prone to electromagnetic interference (EMI). Electronic control devices calculate incorrect outputs because of EMI and sensors give misleading values which can prove fatal in case of automotives. In this paper, the authors have non exhaustively tried to review research work concerned with the investigation of EMI in ICs and prediction of this EMI using various modelling methodologies and measurement setups.

show abstract

Section: Measurement Methods For Emc Predictionmentioning

confidence: 99%

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

Baba

Mustapha²,

Hasbullah³

2022

IJEECS

View full text Add to dashboard Cite

show abstract

“…To reduce the area and have a symmetrical layout of the BJTs, we chose n equal to two and the collector currents I C1 and I C2 in the ratio of 2 : 3. The chosen BJT's ratio requires only two dummy BJTs connected in parallel to Q2 for the compensation of leakages as we used in [9]. Figure 5 shows the symmetrical layout of five BJTs in one row.…”

Section: Collector Leakage Current Compensationmentioning

confidence: 99%

“…We chose the compensation BJT Q3 (see Fig. 5) with a floating emitter [9] and a shorted base-emitter (BE) junction connected to emitter of Q2 [12] as two different versions for the leakage compensation. With the floating emitter, we expect mainly impact of the collector substrate junction leakage.…”

Section: Investigated Bandgap Coresmentioning

confidence: 99%

“…With the increasing advent of high-speed mixed-signal and radio frequency (RF) devices, the automotive industry also sets high requirements for very low electromagnetic emission (EME) and high immunity to electromagnetic interference (EMI). This aggressive EMI can easily couple from an application ambient to the IC via cable harness or printed circuit board (PCB) tracks [9].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

Krolak¹,

Horský²

2022

RADIOENGINEERING

View full text Add to dashboard Cite

This paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.

show abstract

“…To not introduce any error, these building blocks should be designed according to the existing design guidelines to avoid any EMI-induced offset at their outputs [37][38][39][40]. In this way, the proper input DC current I IN can be provided even if still affected by a superimposed EMI current i emi .…”

Section: A New Current Generator Robust To Emimentioning

confidence: 99%

Design of an Ultra-Low Voltage Bias Current Generator Highly Immune to Electromagnetic Interference

Aiello

2021

JLPEA

View full text Add to dashboard Cite

The paper deals with the immunity to Electromagnetic Interference (EMI) of the current source for Ultra-Low-Voltage Integrated Circuits (ICs). Based on the properties of IC building blocks, such as the current-splitter and current correlator, a novel current generator is conceived. The proposed solution is suitable to provide currents to ICs operating in the sub-threshold region even in the presence of an electromagnetic polluted environment. The immunity to EMI of the proposed solution is compared with that of a conventional current mirror and evaluated by analytic means and with reference to the 180 nm CMOS technology process. The analysis highlights how the proposed solution generates currents down to nano-ampere intrinsically robust to the Radio Frequency (RF) interference affecting the input of the current generator, differently to what happens to the output current of a conventional mirror under the same conditions.

show abstract

An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

Cited by 6 publications

References 14 publications

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

Design of an Ultra-Low Voltage Bias Current Generator Highly Immune to Electromagnetic Interference

Contact Info

Product

Resources

About