Abstract:The size effects and physical mechanisms governing small-scale mechanical behavior have important influences on the atomic force microscopy (AFM) measurement. Typically, high surface to volume ratio associated with the small-scale system leads to an appreciable surface force; such that the adhesion of AFM indenter to specimen should be taken into consideration for the nanoindentation and nanoscratch testing. In this work, a finite element method (FEM) model was developed to simulate the adhesive contact betwee… Show more
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