An atomic force microscopy study of polyester surfaces

Jing, Jing; Henriksen, P. N.; Wang, Hong; Marteny, P.

doi:10.1007/bf00356708

Cited by 28 publications

(30 citation statements)

References 8 publications

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“…Assuming that the molecules of PtBuA are in their equilibrium conformations and the molecular chains are mostly in coil shapes [11], the root mean square radius of such a coil can be estimated from [3] r w = 0.096 × 10 −20 (M w × 10 3 ) 0.98 ∼ 10.6 nm (M w ∼ 148 kDa).…”

Section: Discussionmentioning

confidence: 99%

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Bundle structure formation on a polymer film at various temperatures and scanning velocities

Wang

Xiao

2002

Nanotechnology

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The structures formed by atomic force microscopic tip scanning on a 133 nm thick poly(tert-butyl acrylate) (PtBuA) film were examined at temperatures ranging from room temperature to 58• C with various scanning velocities from 1 to 20 µm s −1 . It was observed that bumps were created at low temperatures and high scanning velocities. As the temperature was increased and the scanning velocity was decreased, bundles were produced through aggregation of the bumps. The width of the bundles was about 100 nm. As the temperature was further increased to higher than the glassy-rubbery phase transition temperature, T g ∼ 50• C, of the PtBuA polymer, no bundle structures were formed at low scanning velocities. Our results clearly indicate that the formation of bumps and bundles occurs from the interplay of polymer peeling and relaxation. With polymer peeling taking place on soft polymer surfaces, slower relaxation favours the accumulation of polymer coil displacement and the formation of the bump and bundle structures, while fast relaxation results in the recovery of the polymer perturbation and no formation of surface structures.

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Section: Discussionmentioning

confidence: 99%

“…Some further studies have focused on the formation conditions for such structures. For example, Jing et al [3] found that patterns formed more easily in amorphous polyester film (T g ∼ 70…”

Section: Introductionmentioning

confidence: 99%

Bundle structure formation on a polymer film at various temperatures and scanning velocities

Wang

Xiao

2002

Nanotechnology

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“…Different wear modes have been observed when the AFM tip slides over a polymer surface. As one of the wear modes, the bundle‐type nano patterns perpendicular to the scanning direction have been reported as a typical mode for most thermoplastics polymers, such as polystyrene (PS) (Sills et al ., ), polyester (Jing et al ., ), polyacetylene (Elkaakour et al ., ), polycarbonate (Iwata et al ., ), and poly‐(tert‐butyl acrylate) (Wang et al ., ). Such bundle structures are also found to be formed on icon crystal KBr (Socoliuc et al ., ) and semiconductor AⅢ‐BV (Such et al ., ) surfaces.…”

Section: Introductionmentioning

confidence: 99%

Effect of the molecular weight on deformation states of the polystyrene film by AFM single scanning

Sun

Liang

et al. 2012

Scanning

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Nanobundles patterns can be formed on the surface of most thermoplastic polymers when the atomic force microscope (AFM)-based nanomechanical machining method is employed to scratch their surfaces. Such patterns are reviewed as three-dimensional sine-wave structures. In the present study, the single-line scratch test is used firstly to study different removal states of the polystyrene (PS) polymer with different molecular weights (MWs). Effects of the scratching direction and the scratching velocity on deformation of the PS film and the state of the removed materials are also investigated. Single-wear box test is then employed to study the possibility of forming bundle structures on PS films with different MWs. The experimental results show that the state between the tip and the sample plays a key role in the nano machining process. If the contact radius between the AFM tip and the polymer surface is larger than the chain end-to-end distance, it is designated as the "cutting" state that means the area of both side ridges is less than the area of the groove and materials are removed. If the contact radius is less than the chain end-to-end distance, it is designated as the "plowing" state that means the area of both side ridges is larger than the area of the groove and no materials are removed at all. For the perfect bundles formation on the PS film, the plowing state is ideal condition for the larger MW polymers because of the chains' entanglement.

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“…It is well known 19,20 that imaging of soft materials by AFM can smear the surface material unless care is taken to keep to soft cantilevers and low forces. The AFM images shown in Fig.…”

Section: Atomic Force Microscopy Imaging Prior To Ssims Imagingmentioning

confidence: 99%

Quantification issues in ToF‐SSIMS and AFM co‐analysis in two‐phase systems, exampled by a polymer blend

Gilmore

Seah

Johnstone

2003

Surface & Interface Analysis

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This study concerns the measurement of the surface properties of sensitive materials, exampled by a polymer blend of polyvinyl chloride (PVC) and polycarbonate (PC), by static secondary ion mass spectrometry (SSIMS) and atomic force microscopy (AFM) operated in force modulation microscopy mode. It is shown that SSIMS, although damaging the surface little, causes significant subsurface damage. This changes the material behaviour in the irradiated region and leads to changes in the AFM measurements of both the topography and nanomechanical parameters such as the elastic moduli. Alternatively, if AFM is conducted first, contact with the tip may lead to modification of the surface. In order to minimize damage, soft cantilevers (spring constant ∼0.1 N m −1 ) are used. It is recommended that analyses be conducted on identifiably equivalent or partially overlapping regions, where any damage effects may be separated. Because, in SSIMS, a flood gun neutralizer must be used that irradiates the whole sample, it is recommended that AFM analysis is conducted prior to SSIMS even if different areas of the same sample are to be studied. The fractional areas identified by atomic species in SSIMS and separately by AFM are both the same and give the consistent ratio PVC/PC = 44 : 56. Both of these analyses are characteristic of the substrate below the top monolayer. The fractional areas determined using molecular species in SSIMS and by G-SIMS both give PVC/PC = 20 : 80, which is interpreted to show that more than half of the PVC surface is covered by a monolayer of PC. Crown

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An atomic force microscopy study of polyester surfaces

Cited by 28 publications

References 8 publications

Bundle structure formation on a polymer film at various temperatures and scanning velocities

Bundle structure formation on a polymer film at various temperatures and scanning velocities

Effect of the molecular weight on deformation states of the polystyrene film by AFM single scanning

Quantification issues in ToF‐SSIMS and AFM co‐analysis in two‐phase systems, exampled by a polymer blend

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