We report on the development of a practical, easy-to-use, multi-element, solid-state instrument for detecting and imaging tritium contamination on surfaces. The innovation, which enables this instrumentation, relies on cutting-edge silicon avalanche photodiode (APD) array detector technology to provide an effective coverage area without compromising the overall sensitivity. We discuss the design and assembly of a prototype unit to monitor a surface area of over 900 mm 2 while maintaining a spatial resolution of less than 4 mm. During tests at Los Alamos National Laboratories, we demonstrated tritium counting efficiencies of over 40% and established that this unit can be used to expedite established testing procedures by locating areas of potential activity or when combined with established swipe analysis.