An Application of Time Truncated Single Acceptance Sampling Inspection Plan Based on Generalized Half-Normal Distribution

Tripathi, Harsh; Saha, Mahendra; Alha, Vishal

doi:10.1007/s40745-020-00267-z

Cited by 11 publications

(4 citation statements)

References 11 publications

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“…Let P a (p 1 ) and P a (p 2 ) be the probabilities for lot acceptance at p 1 and p 2 obtained using Eqs. ( 19) and (20).…”

Section: Numerical Illustration Of the Economic Design Of An Amdssp F...mentioning

confidence: 99%

“…( 18) and ( 21) was used to solve this problem subject to Eqs. ( 19), (20) by supposing that α = 0.05, β = 0.05, µ/µ 0 = 8 and N = 25. The result gave optimal parameters for the AMDSS as (n 1 , n 2 , c 1 , c 2 , m) = (8, 3, 2, 4, 1), P a = 0.9556, ASN = 8.4101 and TC = 505.1462.…”

Section: Application Of Real Data (Electronic Device)mentioning

confidence: 99%

“…Several studies presented an ASP for the truncated life test under various lifetime distributions. Tripathi et al [20] presented an SSP for generalized half-normal distribution, where the lifetime experiment was truncated at a specified time, while Rao et al [21] presented an MDSSP that decreased the life of the product under exponentiated half-logistic distribution. A novel ASP for lengthbiased weighted Lomax distribution was created by Al-Omari et al [22] based on a truncated life test, while an attribute-modified chain sample inspection plan was created by Tripathi et al [23] based on a timetruncated life test under the Darna distribution.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Charongrattanasakul¹,

Bamrungsetthapong²,

Kumam³

2023

Computer Systems Science and Engineering

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A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double sampling plan (DSP) and multiple dependent state sampling plan (MDSSP) concepts. Under accelerated conditions, the lifetime of a product follows the Weibull distribution with a known shape parameter, while the scale parameter can be determined using the acceleration factor (AF). The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive. An economic design of the proposed sampling plan was also considered for the ALT. A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number (ASN) and total cost of inspection (TC) under both producer's and consumer's risks. Numerical results are presented to support the AMDSSP for the ALT, while performance comparisons between the AMDSSP, the MDSSP and a single sampling plan (SSP) for the ALT are discussed. Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions. The AMDSSP also had a higher operating characteristic (OC) curve than both the existing sampling plans. Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.

show abstract

“…Let P a (p 1 ) and P a (p 2 ) be the probabilities for lot acceptance at p 1 and p 2 obtained using Eqs. ( 19) and (20).…”

Section: Numerical Illustration Of the Economic Design Of An Amdssp F...mentioning

confidence: 99%

Section: Application Of Real Data (Electronic Device)mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Charongrattanasakul¹,

Bamrungsetthapong²,

Kumam³

2023

Computer Systems Science and Engineering

View full text Add to dashboard Cite

show abstract

“…Malathi and Muthulakshmi [25] developed a zero-one double-acceptance sampling plan based on Marshall-Olkin extended exponential distribution for truncated life tests. Tripathi et al [26] developed an application of time-truncated single-acceptance sampling plan based on generalized halfnormal distribution. Tripathi et al [27] studied double-and group-acceptance sampling plan for truncated life test based on inverse log-logistic distribution.…”

Section: Introductionmentioning

confidence: 99%

Double-Acceptance Sampling Plan for Exponentiated Fréchet Distribution with Known Shape Parameters

Babu

Rao

Rosaiah

2021

Mathematical Problems in Engineering

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We suppose that a product’s lifetime follow the exponentiated Fréchet distribution of defined shape parameters. Based on this assumption, a double-acceptance sampling plan is constructed. The zero and one failure framework is essentially thought of: if no errors are found from the first sample, then the lot is approved; also, if at least two failures occur, it is rejected. In the first sample, if one failure is observed, then the second sample is taken and decided for the same length as the first one. The cumulative sample sizes of the first and second samples are determined on the basis of the stated confidence level of the consumer to ensure that the actual median is longer than the given life. As indicated by the various ratios of the actual median life to specified median lifetime, the operating characteristics are calculated and placed in presented tables. To decrease the risk of the producer at the predefined level, the minimum ratios of this sort are additionally obtained. Lastly, examples are provided for representation reasons for the proposed model.

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Acceptance sampling inspection plan for the Lindley and power Lindley distributed quality characteristics

Saha

Tripathi

Dey³

et al. 2021

Int J Syst Assur Eng Manag

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An Application of Time Truncated Single Acceptance Sampling Inspection Plan Based on Generalized Half-Normal Distribution

Cited by 11 publications

References 11 publications

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Double-Acceptance Sampling Plan for Exponentiated Fréchet Distribution with Known Shape Parameters

Acceptance sampling inspection plan for the Lindley and power Lindley distributed quality characteristics

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