Proceedings., Second International Conference on Properties and Applications of Dielectric Materials
DOI: 10.1109/icpadm.1988.38328
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An application of the new approach of atmospheric correction factors to tests performed on post insulators

Abstract: A. P e r e i r a , C E P E L C O P E L IEE-USPT h e t e s t s m a d e in o r d e r t o s u b s i d i s e the r e v i s i o n o f I E C f 0 . 1 / 1 9 7 3 1 1 1 , for s t u d y i n g t h e a t m o s p h e r i c co.rrect'ion parameters, w e r e done on s e v e r a l t y p e s o f a i r g a p s 1 2 , 3 , 4 , 5 1 . T o verify t h e n e w c o r r e c t i o n factors, s e v e r a l dielectric tests'were d o n e o n s t a t i o n post glass i n s u l a t o r s , w i t h d i f f e r e n t a t m o s p h e r i c conditio… Show more

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