“…In addition to TEM specimen preparation, FIB milling techniques have also been effective in producing specimens for subsequent analysis by scanning electron microscopy~SEM!, secondary ion mass spectrometry~SIMS!, scanning transmission electron microscopy~STEM!, AUGER electron spectroscopy~AES!, and atomic force microscopy~AFM; Mackenzie et al, 1993Mackenzie et al, , 1994Young et al, 1993a;Huffman et al, 1994;Ishitani et al, 1995;Kamino et al, 1998;Prenitzer et al, 1998;Stevie et al, 1999Stevie et al, , 2001Vartuli et al, 1999!. It should be noted that the fundamental concepts of ion-solid interactions presented in this work are equally applicable to any such potential application.…”